Patent | Date |
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Data generation method for semiconductor device, and electron beam exposure system Grant 8,429,573 - Ogino , et al. April 23, 2 | 2013-04-23 |
Exposure method and method of making a semiconductor device Grant 8,298,732 - Minemura , et al. October 30, 2 | 2012-10-30 |
Exposure method using charged particle beam Grant 8,158,312 - Ogino April 17, 2 | 2012-04-17 |
Preparing data for hybrid exposure using both electron beam exposure and reticle exposure in lithographic process Grant 8,141,009 - Miyajima , et al. March 20, 2 | 2012-03-20 |
Parameter extracting method Grant 8,048,600 - Ogino November 1, 2 | 2011-11-01 |
Method for manufacturing semiconductor device or photomask Grant 8,022,376 - Ogino , et al. September 20, 2 | 2011-09-20 |
Exposure Method And Method Of Making A Semiconductor Device App 20110207053 - Minemura; Masahiko ;   et al. | 2011-08-25 |
Exposure data preparation method and exposure method Grant 7,977,018 - Ogino , et al. July 12, 2 | 2011-07-12 |
Charged particle beam projection method Grant 7,939,246 - Ogino May 10, 2 | 2011-05-10 |
Exposure Method Using Charged Particle Beam App 20110033789 - Ogino; Kozo | 2011-02-10 |
Exposure data generator and method thereof Grant 7,861,210 - Ogino , et al. December 28, 2 | 2010-12-28 |
Exposure data generation method and device, exposure data verification method and device and storage medium App 20100162198 - OGINO; Kozo | 2010-06-24 |
Exposure data generation method and device, exposure data verification method and device and storage medium Grant 7,707,540 - Ogino April 27, 2 | 2010-04-27 |
Method For Preparing Data For Exposure And Method For Manufacturing Photo Mask App 20090239160 - MIYAJIMA; Masaaki ;   et al. | 2009-09-24 |
Method For Manufacturing Semiconductor Device Or Photomask App 20090206282 - Ogino; Kozo ;   et al. | 2009-08-20 |
Data Generation Method For Semiconductor Device, And Electron Beam Exposure System App 20090187878 - Ogino; Kozo ;   et al. | 2009-07-23 |
Exposure Data Preparation Method And Exposure Method App 20090176168 - OGINO; Kozo ;   et al. | 2009-07-09 |
Exposure data generator and method thereof App 20090144693 - Ogino; Kozo ;   et al. | 2009-06-04 |
Exposure data generator and method thereof Grant 7,500,219 - Ogino , et al. March 3, 2 | 2009-03-03 |
Charged particle beam projection method and program used therefor App 20070196768 - Ogino; Kozo | 2007-08-23 |
Exposure data generation method and device, exposure data verification method and device and storage medium App 20070192758 - Ogino; Kozo | 2007-08-16 |
Pattern size correcting device and pattern size correcting method Grant 7,240,307 - Aoyama , et al. July 3, 2 | 2007-07-03 |
Method for generating backscattering intensity on the basis of lower layer structure in charged particle beam exposure, and method for fabricating semiconductor device utilizing this method Grant 7,205,078 - Osawa , et al. April 17, 2 | 2007-04-17 |
Parameter extracting method App 20070021938 - Ogino; Kozo | 2007-01-25 |
Exposure data generator and method thereof App 20060195815 - Ogino; Kozo ;   et al. | 2006-08-31 |
Pattern size correcting device and pattern size correcting method App 20050121628 - Aoyama, Hajime ;   et al. | 2005-06-09 |
Method for generating backscattering intensity on the basis of lower layer structure in charged particle beam exposure, and method for fabricating semiconductor device utilizing this method App 20050040344 - Osawa, Morimi ;   et al. | 2005-02-24 |
Rectangle/lattice data conversion method for charged particle beam exposure mask pattern and charged particle beam exposure method Grant 6,677,089 - Ogino , et al. January 13, 2 | 2004-01-13 |
Charged particle beam exposure method Grant 6,544,700 - Ogino April 8, 2 | 2003-04-08 |
Rectangle/lattice data conversion method for charged particle beam exposure mask pattern and charged particle beam exposure method App 20020177056 - Ogino, Kozo ;   et al. | 2002-11-28 |
Charged particle beam exposure method and charged particle beam exposure apparatus App 20020028398 - Ogino, Kozo | 2002-03-07 |