loadpatents
name:-0.021933078765869
name:-0.021196842193604
name:-0.00040411949157715
Ogawa; Kazuhisa Patent Filings

Ogawa; Kazuhisa

Patent Applications and Registrations

Patent applications and USPTO patent grants for Ogawa; Kazuhisa.The latest application filed is for "semiconductor unit and test method".

Company Profile
0.23.20
  • Ogawa; Kazuhisa - Kanagawa JP
  • Ogawa; Kazuhisa - Osaka N/A JP
  • Ogawa; Kazuhisa - Wako N/A JP
  • Ogawa; Kazuhisa - Saitama JP
  • Ogawa; Kazuhisa - Wako-shi JP
  • Ogawa; Kazuhisa - Shinagawa-ku Tokyo JP
  • Ogawa; Kazuhisa - Yokohama JP
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Semiconductor unit and test method
Grant 9,818,661 - Tomita , et al. November 14, 2
2017-11-14
Semiconductor Unit And Test Method
App 20150091603 - Tomita; Manabu ;   et al.
2015-04-02
Test circuit, integrated circuit, and test circuit layout method
Grant 8,954,916 - Ogawa February 10, 2
2015-02-10
Dry fractionation method for oil or fat
Grant 8,772,518 - Murai , et al. July 8, 2
2014-07-08
Dry Fractionation Method For Oil Or Fat
App 20130274495 - Murai; Kenji ;   et al.
2013-10-17
Lubricating system for air-cooled general-purpose engine
Grant 8,474,417 - Ogawa , et al. July 2, 2
2013-07-02
Test Circuit, Integrated Circuit, And Test Circuit Layout Method
App 20130009314 - Ogawa; Kazuhisa
2013-01-10
Engine oil filter and cooling system
Grant 8,347,845 - Ogawa , et al. January 8, 2
2013-01-08
Breather device for engine
Grant 8,181,635 - Ogawa , et al. May 22, 2
2012-05-22
V-type engine
Grant 8,141,525 - Ogawa , et al. March 27, 2
2012-03-27
Air-cooled engine
Grant 7,980,205 - Sato , et al. July 19, 2
2011-07-19
Method for correcting mask pattern, photomask, method for fabricating photomask, electron beam writing method for fabricating photomask, exposure method, semiconductor device, and method for fabricating semiconductor device
Grant 7,799,510 - Ogawa , et al. September 21, 2
2010-09-21
Air-cooled engine
Grant 7,779,792 - Kubo , et al. August 24, 2
2010-08-24
Method for correcting mask pattern, photomask, method for fabricating photomask, electron beam writing method for fabricating photomask, exposure method, semiconductor device, and method for fabricating semiconductor device
Grant 7,767,364 - Ogawa , et al. August 3, 2
2010-08-03
Method For Correcting Mask Pattern, Photomask, Method For Fabricating Photomask, Electron Beam Writing Method For Fabricating Photomask, Exposure Method, Semiconductor Device, And Method For Fabricating Semiconductor Device
App 20100038798 - Ogawa; Kazuhisa ;   et al.
2010-02-18
Air-cooled Engine
App 20100031903 - Sato; Yoshikazu ;   et al.
2010-02-11
Engine Oil Filter System
App 20090314245 - Ogawa; Kazuhisa ;   et al.
2009-12-24
Breather Device For Engine
App 20090301449 - Ogawa; Kazuhisa ;   et al.
2009-12-10
Lubricating System For Air-cooled General-purpose Engine
App 20090301413 - OGAWA; Kazuhisa ;   et al.
2009-12-10
V-type Engine
App 20090301415 - OGAWA; Kazuhisa ;   et al.
2009-12-10
Mask pattern generating method
Grant 7,541,117 - Ogawa , et al. June 2, 2
2009-06-02
Air-cooled Engine
App 20090044769 - Kubo; Yoshihiko ;   et al.
2009-02-19
Fuel tank with filters
Grant 7,429,322 - Fujita , et al. September 30, 2
2008-09-30
Method of forming exposure mask pattern, exposure mask pattern, and method of producing semiconductor device
Grant 7,384,710 - Ogawa , et al. June 10, 2
2008-06-10
Mask Pattern Generating Method
App 20070283313 - Ogawa; Kazuhisa ;   et al.
2007-12-06
Exposure pattern forming method and exposure pattern
Grant 7,200,834 - Ogawa , et al. April 3, 2
2007-04-03
Exposure pattern forming method and exposure pattern
Grant 7,165,235 - Ogawa , et al. January 16, 2
2007-01-16
Method for correcting mask pattern, photomask, method for fabricating photomask, electron beam writing method for fabricating photomask, exposure method, semiconductor device, and method for fabricating semiconductor device
App 20060134532 - Ogawa; Kazuhisa ;   et al.
2006-06-22
Exposure pattern forming method and exposure pattern
Grant 7,000,216 - Ogawa , et al. February 14, 2
2006-02-14
Method of correcting mask pattern
App 20060014082 - Ogawa; Kazuhisa
2006-01-19
Exposure pattern forming method and exposure pattern
App 20050204330 - Ogawa, Kazuhisa ;   et al.
2005-09-15
Exposure pattern forming method and exposure pattern
App 20050174557 - Ogawa, Kazuhisa ;   et al.
2005-08-11
Exposure mask pattern forming method, exposure mask pattern, and semiconductor device manufacturing method
App 20050147893 - Ogawa, Kazuhisa ;   et al.
2005-07-07
Fuel tank
App 20050109685 - Fujita, Yasushi ;   et al.
2005-05-26
Method for mask data verification and computer readable record medium recording the verification program
Grant 6,658,641 - Ashida , et al. December 2, 2
2003-12-02
Method for forming exposure pattern and exposure pattern
App 20030140329 - Ogawa, Kazuhisa ;   et al.
2003-07-24
Method for mask data verification and computer readable record medium recording the verification program
App 20020066069 - Ashida, Isao ;   et al.
2002-05-30
Telephone
Grant D283,509 - Shibayama , et al. April 22, 1
1986-04-22
Telephone
Grant D273,784 - Shibayama , et al. May 8, 1
1984-05-08

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