Odawara; Akikazu
Patent Applications and Registrations
Patent applications and USPTO patent grants for Odawara; Akikazu.The latest application filed is for "x-ray fluorescence analysis apparatus".
- Odawara; Akikazu - Tokyo JP
- Odawara; Akikazu - Chiba JP
- Odawara; Akikazu - Chiba-shi JP
| Patent | Date |
|---|---|
| X-ray fluorescence analysis apparatus Grant 9,645,100 - Tanaka , et al. May 9, 2 | 2017-05-09 |
| Radiation analyzer and method for analyzing radiation Grant 9,229,114 - Tanaka , et al. January 5, 2 | 2016-01-05 |
| X-ray Fluorescence Analysis Apparatus App 20150177167 - TANAKA; Keiichi ; et al. | 2015-06-25 |
| Radiation Analyzer And Method For Analyzing Radiation App 20140048717 - TANAKA; Keiichi ; et al. | 2014-02-20 |
| X-ray analyzer Grant 7,910,888 - Tanaka , et al. March 22, 2 | 2011-03-22 |
| Superconducting radiometry apparatus Grant 7,789,557 - Tanaka , et al. September 7, 2 | 2010-09-07 |
| Superconducting radiometry apparatus App 20100019152 - Tanaka; Keiichi ; et al. | 2010-01-28 |
| Superconducting X-ray detector and X-ray analysis apparatus using the same Grant 7,589,323 - Tanaka , et al. September 15, 2 | 2009-09-15 |
| X-ray Analyzer App 20090184252 - Tanaka; Keiichi ; et al. | 2009-07-23 |
| Superconducting X-Ray Detector And X-Ray Analysis Apparatus Using The Same App 20070291902 - Tanaka; Keiichi ; et al. | 2007-12-20 |
| Superconducting X-ray detection apparatus and superconducting X-ray analyzer using the apparatus Grant 7,241,997 - Odawara , et al. July 10, 2 | 2007-07-10 |
| Three-dimensional structure analyzing system App 20060198494 - Tanaka; Keiichi ; et al. | 2006-09-07 |
| Superconducting X-ray detection apparatus and superconducting X-ray analyzer using the apparatus App 20050184238 - Odawara, Akikazu ; et al. | 2005-08-25 |
| Cooling apparatus and squid microscope using same Grant 6,810,679 - Odawara November 2, 2 | 2004-11-02 |
| Cooling apparatus and SQUID microscope using same App 20030172660 - Odawara, Akikazu | 2003-09-18 |
| Superconductive quantum interference element App 20020097047 - Odawara, Akikazu | 2002-07-25 |
| Cooling apparatus App 20010023592 - Odawara, Akikazu ; et al. | 2001-09-27 |
| Superconducting quantum interference device fluxmeter and nondestructive inspection apparatus Grant 5,854,492 - Chinone , et al. December 29, 1 | 1998-12-29 |
| Nondestructive inspection apparatus with superconducting magnetic sensor Grant 5,834,938 - Odawara , et al. November 10, 1 | 1998-11-10 |
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