Obuki; Tomoharu
Patent Applications and Registrations
Patent applications and USPTO patent grants for Obuki; Tomoharu.The latest application filed is for "specimen testing device and method for creating absorbed current image".
- Obuki; Tomoharu - Hitachinaka N/A JP
| Patent | Date |
|---|---|
| Inspection device Grant 8,816,712 - Nakamura , et al. August 26, 2 | 2014-08-26 |
| Specimen Testing Device and Method for Creating Absorbed Current Image App 20130119999 - Obuki; Tomoharu ; et al. | 2013-05-16 |
| Specimen inspection equipment and how to make the electron beam absorbed current images Grant 8,178,840 - Obuki , et al. May 15, 2 | 2012-05-15 |
| Sample inspection apparatus Grant 7,989,766 - Nara , et al. August 2, 2 | 2011-08-02 |
| Inspection Device App 20110140729 - Nakamura; Mitsuhiro ; et al. | 2011-06-16 |
| Specimen Inspection Equipment and How to Make the Electron Beam Absorbed Current Images App 20100116986 - Obuki; Tomoharu ; et al. | 2010-05-13 |
| Specimen inspection equipment and how to make electron beam absorbed current images Grant 7,663,104 - Obuki , et al. February 16, 2 | 2010-02-16 |
| Sample Inspection Apparatus App 20090250610 - NARA; Yasuhiko ; et al. | 2009-10-08 |
| Specimen Inspection Equipment and How to Make the Electron Beam Absorbed Current Images App 20080203297 - OBUKI; Tomoharu ; et al. | 2008-08-28 |
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