OBIKANE; Tadashi
Patent Applications and Registrations
Patent applications and USPTO patent grants for OBIKANE; Tadashi.The latest application filed is for "test device, change kit, and method of exchanging change kit".
- OBIKANE; Tadashi - Yamanashi JP
- OBIKANE; Tadashi - Nirasaki-shi Yamanashi
- Obikane; Tadashi - Nirasaki N/A JP
- OBIKANE; Tadashi - Nirasaki City JP
- Obikane; Tadashi - Kofu JP
| Patent | Date |
|---|---|
| Substrate Delivery Method And Substrate Delivery Device App 20220172964 - OBIKANE; Tadashi | 2022-06-02 |
| Test Device, Change Kit, And Method Of Exchanging Change Kit App 20220172978 - HOSAKA; Hiroki ; et al. | 2022-06-02 |
| Transfer Device, Transfer Method, And Inspection System App 20190189482 - OBIKANE; Tadashi ; et al. | 2019-06-20 |
| Transfer and inspection devices of object to be inspected Grant 8,905,700 - Obikane December 9, 2 | 2014-12-09 |
| Probe apparatus and substrate transfer method Grant 8,726,748 - Obikane , et al. May 20, 2 | 2014-05-20 |
| Probing apparatus and probing method Grant 8,310,261 - Hosaka , et al. November 13, 2 | 2012-11-13 |
| FOUP opening/closing device and probe apparatus Grant 8,267,633 - Obikane September 18, 2 | 2012-09-18 |
| Probe Apparatus And Substrate Transfer Method App 20110107858 - Obikane; Tadashi ; et al. | 2011-05-12 |
| Processing apparatus Grant 7,887,280 - Hosaka , et al. February 15, 2 | 2011-02-15 |
| Probe apparatus Grant 7,741,837 - Obikane , et al. June 22, 2 | 2010-06-22 |
| Each inspection units of a probe apparatus is provided with an imaging unit to take an image of a wafer Grant 7,701,236 - Akiyama , et al. April 20, 2 | 2010-04-20 |
| Foup Opening/closing Device And Probe Apparatus App 20100040441 - OBIKANE; Tadashi | 2010-02-18 |
| Wafer carrying-in/out apparatus Grant D607,424 - Hosaka , et al. January 5, 2 | 2010-01-05 |
| Probing Apparatus And Probing Method App 20090267626 - HOSAKA; Hiroki ; et al. | 2009-10-29 |
| Wafer carrying-in/out apparatus Grant D602,882 - Hosaka , et al. October 27, 2 | 2009-10-27 |
| Probing apparatus and probing method Grant 7,583,096 - Hosaka , et al. September 1, 2 | 2009-09-01 |
| Wafer carrying-in/out machine Grant D592,230 - Hosaka , et al. May 12, 2 | 2009-05-12 |
| Probe Apparatus App 20080290886 - Akiyama; Shuji ; et al. | 2008-11-27 |
| Probe Apparatus App 20080284455 - OBIKANE; Tadashi ; et al. | 2008-11-20 |
| Transfer And Inspection Devices Of Object To Be Inspected App 20080240891 - Obikane; Tadashi | 2008-10-02 |
| Processing Apparatus App 20070264104 - HOSAKA; Hiroki ; et al. | 2007-11-15 |
| Probing Apparatus And Probing Method App 20070262783 - HOSAKA; Hiroki ; et al. | 2007-11-15 |
| Load port capable of coping with different types of cassette containing substrates to be processed Grant 6,830,651 - Obikane December 14, 2 | 2004-12-14 |
| Load port capable of coping with different types of cassette containing substrates to be processed App 20040040661 - Obikane, Tadashi | 2004-03-04 |
| Semiconductor wafer probing apparatus Grant 5,828,225 - Obikane , et al. October 27, 1 | 1998-10-27 |
| Probe apparatus Grant 5,086,270 - Karasawa , et al. February 4, 1 | 1992-02-04 |
| Electric probing test machine Grant 4,950,982 - Obikane , et al. August 21, 1 | 1990-08-21 |
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