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name:-0.0067660808563232
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O'HARA; Anthony Patent Filings

O'HARA; Anthony

Patent Applications and Registrations

Patent applications and USPTO patent grants for O'HARA; Anthony.The latest application filed is for "a method for detecting defects in thin film layers".

Company Profile
0.8.10
  • O'HARA; Anthony - Livingston Lothian GB
  • O'Hara; Anthony - West Lothian N/A GB
  • O'Hara; Anthony - Livingston GB
  • O'HARA; Anthony - Lothian GB
  • O'Hara; Anthony - Edinburgh GB
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
A Method For Detecting Defects In Thin Film Layers
App 20210341393 - O'HARA; Anthony ;   et al.
2021-11-04
Vapour etch of silicon dioxide with improved selectivity
Grant 10,354,884 - O'Hara July 16, 2
2019-07-16
Selectivity in a xenon difluoride etch process
Grant 10,173,894 - O'Hara J
2019-01-08
Selectivity In A Xenon Difluoride Etch Process
App 20180029883 - O'HARA; Anthony
2018-02-01
Selectivity in a xenon difluoride etch process
Grant 9,786,526 - O'Hara October 10, 2
2017-10-10
Deposition Technique For Depositing A Coating On A Device
App 20140308822 - O'Hara; Anthony
2014-10-16
Method of etching a sacrificial silicon oxide layer
Grant 8,679,354 - O'Hara March 25, 2
2014-03-25
Vapour Etch Of Silicon Dioxide With Improved Selectivity
App 20140017901 - O'Hara; Anthony
2014-01-16
Selectivity In A Xenon Difluoride Etch Process
App 20120238101 - O'Hara; Anthony
2012-09-20
Method and apparatus for monitoring a microstructure etching process
Grant 7,672,750 - O'Hara , et al. March 2, 2
2010-03-02
Method Of Etching A Sacrificial Silicon Oxide Layer
App 20090308843 - O'Hara; Anthony
2009-12-17
Method And Apparatus For Monitoring A Microstructure Etching Process
App 20080147229 - O'Hara; Anthony ;   et al.
2008-06-19
Method and Apparatus for the Etching of Microstructures
App 20080035607 - O'Hara; Anthony ;   et al.
2008-02-14

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