NU ECO Engineering Co., Ltd.
Patent Applications and Registrations
Patent applications and USPTO patent grants for NU ECO Engineering Co., Ltd..The latest application filed is for "radical generator and molecular beam epitaxy apparatus".
- NU ECO Engineering Co., Ltd. - Miyoshi-shi N/A JP
- Nu Eco Engineering Co., Ltd. - Nishikamo-Gun Aichi JP
- NU Eco Engineering Co., Ltd. - Miyoshi-shi, Aichi JP
- NU Eco Engineering Co., Ltd. - Aichi JP
| Patent | Date |
|---|---|
| Radical generator and molecular beam epitaxy apparatus Grant 10,577,719 - Hori , et al. | 2020-03-03 |
| Radical Generator And Molecular Beam Epitaxy Apparatus App 20160355946 - HORI; Masaru ; et al. | 2016-12-08 |
| Radical generator and molecular beam epitaxy apparatus Grant 9,447,518 - Hori , et al. September 20, 2 | 2016-09-20 |
| Plasma generator Grant 8,961,888 - Hori , et al. February 24, 2 | 2015-02-24 |
| Multi-micro hollow cathode light source and atomic absorption sepctrometer Grant 8,638,034 - Hori , et al. January 28, 2 | 2014-01-28 |
| Spectroscopy method and spectroscope Grant 8,351,039 - Ito , et al. January 8, 2 | 2013-01-08 |
| Method for producing graphene Grant 8,349,142 - Hori , et al. January 8, 2 | 2013-01-08 |
| Light source Grant 8,310,673 - Hori , et al. November 13, 2 | 2012-11-13 |
| Spectroscopy method and spectroscope App 20110063609 - Ito; Masafumi ; et al. | 2011-03-17 |
| Plasma Generator App 20110042008 - Hori; Masaru ; et al. | 2011-02-24 |
| Spectroscopy method and spectroscope Grant 7,855,788 - Ito , et al. December 21, 2 | 2010-12-21 |
| Atmospheric pressure plasma generator App 20100258247 - Hori; Masaru ; et al. | 2010-10-14 |
| Particle density measuring probe and particle density measuring equipment Grant 7,782,463 - Hori , et al. August 24, 2 | 2010-08-24 |
| Atomic analyzer Grant 7,710,562 - Hori , et al. May 4, 2 | 2010-05-04 |
| Particle density measuring probe and particle density measuring equipment App 20090237667 - Hori; Masanu ; et al. | 2009-09-24 |
| Atomic analyzer App 20080239312 - Hori; Masaru ; et al. | 2008-10-02 |
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