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Patent applications and USPTO patent grants for Notani; Yoshihiro.The latest application filed is for "semiconductor devices and methods for inspecting the same".
Patent | Date |
---|---|
Method for inspecting transmission line characteristic of a semiconductor device using signal reflection measurement Grant 7,622,930 - Notani , et al. November 24, 2 | 2009-11-24 |
Semiconductor Devices And Methods For Inspecting The Same App 20080246554 - Notani; Yoshihiro ;   et al. | 2008-10-09 |
High frequency semiconductor device Grant 7,321,170 - Notani January 22, 2 | 2008-01-22 |
High frequency semiconductor device App 20060187977 - Notani; Yoshihiro | 2006-08-24 |
Sample assembly for thermoelectric analyzer Grant 6,791,335 - Hirayama , et al. September 14, 2 | 2004-09-14 |
Method for measuring surface leakage current of sample Grant 6,570,390 - Hirayama , et al. May 27, 2 | 2003-05-27 |
Method for measuring surface leakage current of sample App 20020030504 - Hattori, Ryo ;   et al. | 2002-03-14 |
Integrated circuit device Grant 5,675,184 - Matsubayashi , et al. October 7, 1 | 1997-10-07 |
Film carrier signal transmission line having separating grooves Grant 5,426,399 - Matsubayashi , et al. June 20, 1 | 1995-06-20 |
High frequency signal transmission tape Grant 5,349,317 - Notani , et al. September 20, 1 | 1994-09-20 |
Microwave IC package Grant 5,294,897 - Notani , et al. March 15, 1 | 1994-03-15 |
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