Norris; Alan D.
Patent Applications and Registrations
Patent applications and USPTO patent grants for Norris; Alan D..The latest application filed is for "method for performing a burn-in test".
- Norris; Alan D. - Hinesburg VT
- Norris; Alan D - Hinesburg VT
| Patent | Date |
|---|---|
| Self-aligned Schottky diode Grant 8,008,142 - Botula , et al. August 30, 2 | 2011-08-30 |
| Method for performing a burn-in test Grant 7,463,548 - Norris , et al. December 9, 2 | 2008-12-09 |
| Method For Performing A Burn-in Test App 20070165481 - Norris; Alan D. ; et al. | 2007-07-19 |
| Method for performing a burn-in test Grant 7,243,276 - Norris , et al. July 10, 2 | 2007-07-10 |
| Timer lockout circuit for synchronous applications Grant 7,221,601 - Jacunski , et al. May 22, 2 | 2007-05-22 |
| Command multiplier for built-in-self-test Grant 7,194,670 - Fales , et al. March 20, 2 | 2007-03-20 |
| Timer lockout circuit for synchronous applications App 20060152994 - Jacunski; Mark D. ; et al. | 2006-07-13 |
| Timer lockout circuit for synchronous applications Grant 7,068,564 - Jacunski , et al. June 27, 2 | 2006-06-27 |
| A Command Multiplier for Built-In-Self-Test App 20050193253 - Fales, Jonathan R. ; et al. | 2005-09-01 |
| Method For Performing A Burn-in Test App 20050102590 - Norris, Alan D. ; et al. | 2005-05-12 |
| Timer lockout circuit for synchronous applications App 20040264289 - Jacunski, Mark D ; et al. | 2004-12-30 |
| Internal data generation and compare via unused external pins App 20040133827 - Norris, Alan D. ; et al. | 2004-07-08 |
| Method for guaranteeing a minimum data strobe valid window and a minimum data valid window for DDR memory devices Grant 6,708,298 - Corbin, Jr. , et al. March 16, 2 | 2004-03-16 |
| Method for testing and guaranteeing that skew between two signals meets predetermined criteria Grant 6,658,604 - Corbin , et al. December 2, 2 | 2003-12-02 |
| Method for guaranteeing a minimum data strobe valid window and a minimum data valid window for DDR memory devices App 20020099987 - Corbin, William R. ; et al. | 2002-07-25 |
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