Norcott; Maurice Heathcote

Patent Applications and Registrations

Patent applications and USPTO patent grants for Norcott; Maurice Heathcote.The latest application filed is for "high density integrated circuit apparatus, test probe and methods of use thereof".

Company Profile

0.15.58

Norcott; Maurice Heathcote - Valley Cottage NY
Norcott; Maurice Heathcote - San Jose CA
Norcott; Maurice Heathcote - Fishkill NY

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
High Density Integrated Circuit Apparatus, Test Probe And Methods Of Use Thereof App 20100052715 - Beaman; Brian Samuel ; et al.	2010-03-04
High Density Integrated Circuit Apparatus, Test Probe And Methods Of Use Thereof App 20100045324 - Beaman; Brian Samuel ; et al.	2010-02-25
High Density Integrated Circuit Apparatus, Test Probe And Methods Of Use Thereof App 20100045320 - Beaman; Brian Samuel ; et al.	2010-02-25
High Density Integrated Circuit Apparatus, Test Probe And Methods Of Use Thereof App 20100045317 - Beaman; Brian Samuel ; et al.	2010-02-25
High Density Integrated Circuit Apparatus, Test Probe And Methods Of Use Thereof App 20100045318 - Beaman; Brian Samuel ; et al.	2010-02-25
High Density Integrated Circuit Apparatus, Test Probe And Methods Of Use Thereof App 20100045266 - Beaman; Brian Samuel ; et al.	2010-02-25
High Density Integrated Circuit Apparatus, Test Probe And Methods Of Use Thereof App 20100045321 - Beaman; Brian Samuel ; et al.	2010-02-25
High Density Integrated Circuit Apparatus, Test Probe And Methods Of Use Thereof App 20090315579 - Beaman; Brian Samuel ; et al.	2009-12-24
High density integrated circuit apparatus, test probe and methods of use thereof Grant 7,538,565 - Beaman , et al. May 26, 2	2009-05-26
High Density Integrated Circuit Apparatus, Test Probe And Methods Of Use Thereof App 20090128176 - Beaman; Brian Samuel ; et al.	2009-05-21
Control of buried oxide in SIMOX Grant 7,492,008 - Fox , et al. February 17, 2	2009-02-17
High Density Integrated Circuit Apparatus, Test Probe And Methods Of Use Thereof App 20080129320 - Beaman; Brian Samuel ; et al.	2008-06-05
High Density Integrated Circuit Apparatus, Test Probe And Methods Of Use Thereof App 20080132094 - Beaman; Brian Samuel ; et al.	2008-06-05
High Density Integrated Circuit Apparatus, Test Probe And Methods Of Use Thereof App 20080129319 - Beaman; Brian Samuel ; et al.	2008-06-05
High Density Integrated Circuit Apparatus, Test Probe And Methods Of Use Thereof App 20080123310 - Beaman; Brian Samuel ; et al.	2008-05-29
High Density Integrated Circuit Apparatus, Test Probe And Methods Of Use Thereof App 20080121879 - Beaman; Brian Samuel ; et al.	2008-05-29
High Density Integrated Circuit Apparatus, Test Probe And Methods Of Use Thereof App 20080116915 - Beaman; Brian Samuel ; et al.	2008-05-22
High Density Integrated Circuit Apparatus, Test Probe And Methods Of Use Thereof App 20080116912 - Beaman; Brian Samuel ; et al.	2008-05-22
High Density Integrated Circuit Apparatus, Test Probe And Methods Of Use Thereof App 20080116913 - Beaman; Brian Samuel ; et al.	2008-05-22
High Density Integrated Circuit Apparatus, Test Probe And Methods Of Use Thereof App 20080117613 - Beaman; Brian Samuel ; et al.	2008-05-22
High Density Integrated Circuit Apparatus, Test Probe And Methods Of Use Thereof App 20080117612 - Beaman; Brian Samuel ; et al.	2008-05-22
High Density Integrated Circuit Apparatus, Test Probe And Methods Of Use Thereof App 20080117611 - Beaman; Brian Samuel ; et al.	2008-05-22
High Density Integrated Circuit Apparatus, Test Probe And Methods Of Use Thereof App 20080116916 - Beaman; Brian Samuel ; et al.	2008-05-22
High Density Integrated Circuit Apparatus, Test Probe And Methods Of Use Thereof App 20080116914 - Beaman; Brian Samuel ; et al.	2008-05-22
High Density Integrated Circuit Apparatus, Test Probe And Methods Of Use Thereof App 20080112147 - Beaman; Brian Samuel ; et al.	2008-05-15
High Density Integrated Circuit Apparatus, Test Probe And Methods Of Use Thereof App 20080111568 - Beaman; Brian Samuel ; et al.	2008-05-15
High Density Integrated Circuit Apparatus, Test Probe And Methods Of Use Thereof App 20080112145 - Beaman; Brian Samuel ; et al.	2008-05-15
High Density Integrated Circuit Apparatus, Test Probe And Methods Of Use Thereof App 20080112148 - Beaman; Brian Samuel ; et al.	2008-05-15
High Density Integrated Circuit Apparatus, Test Probe And Methods Of Use Thereof App 20080112144 - Beaman; Brian Samuel ; et al.	2008-05-15
High Density Integrated Circuit Apparatus, Test Probe And Methods Of Use Thereof App 20080112149 - Beaman; Brian Samuel ; et al.	2008-05-15
High Density Integrated Circuit Apparatus, Test Probe And Methods Of Use Thereof App 20080111570 - Beaman; Brian Samuel ; et al.	2008-05-15
High Density Integrated Circuit Apparatus, Test Probe And Methods Of Use Thereof App 20080111569 - Beaman; Brian Samuel ; et al.	2008-05-15
High Density Integrated Circuit Apparatus, Test Probe And Methods Of Use Thereof App 20080112146 - Beaman; Brian Samuel ; et al.	2008-05-15
High Density Integrated Circuit Apparatus, Test Probe And Methods Of Use Thereof App 20080106282 - Beaman; Brian Samuel ; et al.	2008-05-08
High Density Integrated Circuit Apparatus, Test Probe And Methods Of Use Thereof App 20080106284 - Beaman; Brian Samuel ; et al.	2008-05-08
High Density Integrated Circuit Apparatus, Test Probe And Methods Of Use Thereof App 20080106872 - Beaman; Brian Samuel ; et al.	2008-05-08
High Density Integrated Circuit Apparatus, Test Probe And Methods Of Use Thereof App 20080106285 - Beaman; Brian Samuel ; et al.	2008-05-08
High Density Integrated Circuit Apparatus, Test Probe And Methods Of Use Thereof App 20080106291 - Beaman; Brian Samuel ; et al.	2008-05-08
High Density Integrated Circuit Apparatus, Test Probe And Methods Of Use Thereof App 20080106281 - Beaman; Brian Samuel ; et al.	2008-05-08
High Density Integrated Circuit Apparatus, Test Probe And Methods Of Use Thereof App 20080106283 - Beaman; Brian Samuel ; et al.	2008-05-08
High Density Integrated Circuit Apparatus, Test Probe And Methods Of Use Thereof App 20080100317 - Beaman; Brian Samuel ; et al.	2008-05-01
High Density Integrated Circuit Apparatus, Test Probe And Methods Of Use Thereof App 20080100324 - Beaman; Brian Samuel ; et al.	2008-05-01
High Density Integrated Circuit Apparatus, Test Probe And Methods Of Use Thereof App 20080100318 - Beaman; Brian Samuel ; et al.	2008-05-01
High Density Integrated Circuit Apparatus, Test Probe And Methods Of Use Thereof App 20080100316 - Beaman; Brian Samuel ; et al.	2008-05-01
High Density Cantilevered Probe For Electronic Devices App 20080088332 - Beaman; Brian Samuel ; et al.	2008-04-17
High Density Integrated Circuit Apparatus, Test Probe And Methods Of Use Thereof App 20080048690 - Beaman; Brian Samuel ; et al.	2008-02-28
High Density Integrated Circuit Apparatus, Test Probe And Methods Of Use Thereof App 20080047741 - Beaman; Brian Samuel ; et al.	2008-02-28
High Density Integrated Circuit Apparatus, Test Probe And Methods Of Use Thereof App 20080048697 - Beaman; Brian Samuel ; et al.	2008-02-28
High Density Integrated Circuit Apparatus, Test Probe And Methods Of Use Thereof App 20080048691 - Beaman; Brian Samuel ; et al.	2008-02-28
Method for fabricating a structure for making contact with a device Grant 7,332,922 - Beaman , et al. February 19, 2	2008-02-19
High Density Cantilevered Probe For Electronic Devices App 20080030215 - Beaman; Brian Samuel ; et al.	2008-02-07
High Density Cantilevered Probe For Electronic Devices App 20080024154 - Beaman; Brian Samuel ; et al.	2008-01-31
High Density Cantilevered Probe For Electronic Devices App 20080024155 - Beaman; Brian Samuel ; et al.	2008-01-31
High density integrated circuit apparatus, test probe and methods of use thereof App 20070271781 - Beaman; Brian Samuel ; et al.	2007-11-29
High density cantilevered probe for electronic devices App 20050179456 - Beaman, Brian Samuel ; et al.	2005-08-18
Method for fabricating a structure for making contact with an IC device Grant 6,880,245 - Beaman , et al. April 19, 2	2005-04-19
High density integrated circuit apparatus, test probe and methods of use thereof App 20050062492 - Beaman, Brian Samuel ; et al.	2005-03-24
Control of buried oxide in SIMOX App 20050003626 - Fox, Stephen Richard ; et al.	2005-01-06
Control of buried oxide in SIMOX Grant 6,784,072 - Fox , et al. August 31, 2	2004-08-31
High density cantilevered probe for electronic devices App 20040130343 - Beaman, Brian Samuel ; et al.	2004-07-08
Method of forming a structure for electronic devices contact locations Grant 6,722,032 - Beaman , et al. April 20, 2	2004-04-20
Control of buried oxide in SIMOX App 20040013886 - Fox, Stephen Richard ; et al.	2004-01-22
High density integrated circuit apparatus, test probe and methods of use thereof App 20020014004 - Beaman, Brian Samuel ; et al.	2002-02-07
High density integrated circuit apparatus, test probe and methods of use thereof Grant 6,334,247 - Beaman , et al. January 1, 2	2002-01-01
High density cantilevered probe for electronic devices App 20010054907 - Beaman, Brian Samuel ; et al.	2001-12-27
High density cantilevered probe for electronic devices Grant 6,329,827 - Beaman , et al. December 11, 2	2001-12-11
High density integrated circuit apparatus, test probe and methods of use thereof Grant 6,300,780 - Beaman , et al. October 9, 2	2001-10-09
High density test probe with rigid surface structure Grant 6,062,879 - Beaman , et al. May 16, 2	2000-05-16
High density cantilevered probe for electronic devices Grant 5,914,614 - Beaman , et al. June 22, 1	1999-06-22
Integral rigid chip test probe Grant 5,838,160 - Beaman , et al. November 17, 1	1998-11-17
Test probe for high density integrated circuits, methods of fabrication thereof and methods of use thereof Grant 5,821,763 - Beaman , et al. October 13, 1	1998-10-13
High density cantilevered probe for electronic devices Grant 5,811,982 - Beaman , et al. September 22, 1	1998-09-22
High density test probe with rigid surface structure Grant 5,785,538 - Beaman , et al. July 28, 1	1998-07-28

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