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Patent applications and USPTO patent grants for NOOT; Marc Johannes.The latest application filed is for "metrology method".
Patent | Date |
---|---|
Metrology Method App 20220075276 - MATHIJSSEN; Simon Gijsbert Josephus ;   et al. | 2022-03-10 |
Metrology method and apparatus and computer program Grant 10,908,513 - Noot , et al. February 2, 2 | 2021-02-02 |
Metrology method and apparatus, computer program and lithographic system Grant 10,705,437 - Javaheri , et al. | 2020-07-07 |
Metrology parameter determination and metrology recipe selection Grant 10,451,978 - Bhattacharyya , et al. Oc | 2019-10-22 |
Inspection method and apparatus, and corresponding lithographic apparatus Grant 10,295,913 - Middlebrooks , et al. | 2019-05-21 |
Metrology Method and Apparatus, Computer Program and Lithographic System App 20190107785 - JAVAHERI; Narjes ;   et al. | 2019-04-11 |
Metrology Method and Apparatus and Computer Program App 20190033727 - NOOT; Marc Johannes ;   et al. | 2019-01-31 |
Metrology Parameter Determination And Metrology Recipe Selection App 20190004437 - Bhattacharyya; Kaustuve ;   et al. | 2019-01-03 |
Inspection Method and Apparatus, and Corresponding Lithographic Apparatus App 20130135600 - MIDDLEBROOKS; Scott Anderson ;   et al. | 2013-05-30 |
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