loadpatents
name:-0.018326044082642
name:-0.015203952789307
name:-0.0032827854156494
Nonaka; Yoshio Patent Filings

Nonaka; Yoshio

Patent Applications and Registrations

Patent applications and USPTO patent grants for Nonaka; Yoshio.The latest application filed is for "eddy current flaw detection system and eddy current flaw detection method".

Company Profile
4.17.14
  • Nonaka; Yoshio - Mito JP
  • - Hitachi JP
  • Nonaka; Yoshio - Hitachi N/A JP
  • - Mito JP
  • Nonaka; Yoshio - Kasugai JP
  • Nonaka; Yoshio - Kasugai-shi JP
  • Nonaka; Yoshio - Kodaira JP
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Eddy current flaw detection system and eddy current flaw detection method
Grant 9,222,915 - Nishimizu , et al. December 29, 2
2015-12-29
Apparatus for ultrasonic inspection of reactor pressure vessel
Grant 08619939 -
2013-12-31
Ultrasonic inspection system and ultrasonic inspection method
Grant 8,616,062 - Kono , et al. December 31, 2
2013-12-31
Apparatus for ultrasonic inspection of reactor pressure vessel
Grant 8,619,939 - Nakamura , et al. December 31, 2
2013-12-31
Ultrasonic inspection system and ultrasonic inspection method
Grant 08616062 -
2013-12-31
Apparatus for ultrasonic inspection of reactor pressure vessel
Grant 8,576,974 - Nakamura , et al. November 5, 2
2013-11-05
Eddy Current Flaw Detection System and Eddy Current Flaw Detection Method
App 20130193960 - NISHIMIZU; Akira ;   et al.
2013-08-01
Method and apparatus for evaluating length of defect in eddy current testing
Grant 8,339,130 - Nishimizu , et al. December 25, 2
2012-12-25
Ultrasonic inspection method and ultrasonic inspection apparatus
Grant 8,250,923 - Ehara , et al. August 28, 2
2012-08-28
Eddy current flaw detection probe
Grant 8,228,058 - Nishimizu , et al. July 24, 2
2012-07-24
Eddy current testing device
Grant 8,183,862 - Endo , et al. May 22, 2
2012-05-22
Ultrasonic Inspection System And Ultrasonic Inspection Method
App 20110197679 - KONO; Naoyuki ;   et al.
2011-08-18
Method And Apparatus For Evaluating Length Of Defect In Eddy Current Testing
App 20110148404 - NISHIMIZU; Akira ;   et al.
2011-06-23
Apparatus For Ultrasonic Inspection Of Reactor Pressure Vessel
App 20110103536 - Nakamura; Motoyuki ;   et al.
2011-05-05
Apparatus For Ultrasonic Inspection Of Reactor Pressure Vessel
App 20110096888 - NAKAMURA; Motoyuki ;   et al.
2011-04-28
Apparatus for ultrasonic inspection of reactor pressure vessel
Grant 7,929,656 - Nakamura , et al. April 19, 2
2011-04-19
Method and apparatus for evaluating length of defect in eddy current testing
Grant 7,911,206 - Nishimizu , et al. March 22, 2
2011-03-22
Method and apparatus for ultrasonic inspection of reactor pressure vessel
Grant 7,693,251 - Kono , et al. April 6, 2
2010-04-06
Ultrasonic Inspection Method And Ultrasonic Inspection Apparatus
App 20090235749 - Ehara; Kazuya ;   et al.
2009-09-24
Eddy Current Testing Device
App 20090230952 - Endo; Hisashi ;   et al.
2009-09-17
Apparatus For Ultrasonic Inspection Of Reactor Pressure Vessel
App 20090122942 - Nakamura; Motoyuki ;   et al.
2009-05-14
Eddy Current Flaw Detection Probe
App 20090009162 - NISHIMIZU; Akira ;   et al.
2009-01-08
Method And Apparatus For Ultrasonic Inspection Of Reactor Pressure Vessel
App 20080037695 - KONO; Naoyuki ;   et al.
2008-02-14
Method And Apparatus For Evaluating Length Of Defect In Eddy Current Testing
App 20080004817 - NISHIMIZU; Akira ;   et al.
2008-01-03
Rolling die and a method of making a rod with a ball portion
Grant 7,278,286 - Taniguchi , et al. October 9, 2
2007-10-09
Eddy current testing probe and eddy current testing apparatus
Grant 7,235,967 - Nishimizu , et al. June 26, 2
2007-06-26
Rolling die and a method of making a rod with a ball portion
App 20070022795 - Taniguchi; Naoshige ;   et al.
2007-02-01
Eddy current testing probe and eddy current testing apparatus
App 20060170420 - Nishimizu; Akira ;   et al.
2006-08-03
Rolling die
App 20050217345 - Taniguchi, Naoshige ;   et al.
2005-10-06
Method of providing semiconductor pellet with heat sink
Grant 4,123,293 - Okikawa , et al. October 31, 1
1978-10-31

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