Nokes; Mark

Patent Applications and Registrations

Patent applications and USPTO patent grants for Nokes; Mark.The latest application filed is for "detection system for nanometer scale topographic measurements of reflective surfaces".

Company Profile

0.6.3

Nokes; Mark - Palo Alto CA US

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Detection system for nanometer scale topographic measurements of reflective surfaces Grant 8,384,903 - Nielsen , et al. February 26, 2	2013-02-26
Detection system for nanometer scale topographic measurements of reflective surfaces App 20080225275 - Nielsen; Henrik K. ; et al.	2008-09-18
Detection system for nanometer scale topographic measurements of reflective surfaces Grant 7,342,672 - Nielsen , et al. March 11, 2	2008-03-11
Detection system for nanometer scale topographic measurements of reflective surfaces App 20060092427 - Nielsen; Henrik K. ; et al.	2006-05-04
Detection system for nanometer scale topographic measurements of reflective surfaces Grant 6,999,183 - Nielsen , et al. February 14, 2	2006-02-14
Detection System For Nanometer Scale Topographic Measurements Of Reflective Surfaces App 20010013936 - NIELSEN, HENRIK K. ; et al.	2001-08-16
High sensitivity, large detection area particle sensor for vacuum applications Grant 5,266,798 - Borden , et al. November 30, 1	1993-11-30
High sensitivity, large detection area particle sensor for vacuum applications Grant 5,132,548 - Borden , et al. July 21, 1	1992-07-21

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