| Patent | Date |
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Semiconductor Test Apparatus And Semiconductor Test Method
App 20220244292 - Ueda; Yoshiyuki ; et al. | 2022-08-04 |
Electrical Characteristic Inspection Device For Semiconductor Device And Electrical Characteristic Inspection Method For Semiconductor Device
App 20220229103 - OGATA; Sumito ; et al. | 2022-07-21 |
Semiconductor test apparatus, semiconductor device test method, and semiconductor device manufacturing method
Grant 11,380,596 - Ebiike , et al. July 5, 2 | 2022-07-05 |
Semiconductor Test Apparatus, Semiconductor Device Test Method, And Semiconductor Device Manufacturing Method
App 20210098314 - EBIIKE; Yuji ; et al. | 2021-04-01 |
Evaluation apparatus of semiconductor device and method of evaluating semiconductor device using the same
Grant 10,725,086 - Okada , et al. | 2020-07-28 |
Evaluation apparatus for semiconductor device and evaluation method for semiconductor device
Grant 10,495,668 - Noguchi , et al. De | 2019-12-03 |
Evaluation apparatus for semiconductor device and evaluation method for semiconductor device
Grant 10459005 - | 2019-10-29 |
Evaluation apparatus and evaluation method
Grant 10,436,833 - Okada , et al. O | 2019-10-08 |
Device and method for inspecting position of probe, and semiconductor evaluation apparatus
Grant 10,359,448 - Okada , et al. | 2019-07-23 |
Probe position inspection apparatus, semiconductor device inspection apparatus and semiconductor device inspection method
Grant 10,209,273 - Takesako , et al. Feb | 2019-02-19 |
Semiconductor device evaluation jig, semiconductor device evaluation apparatus, and semiconductor device evaluation method
Grant 10,168,380 - Noguchi , et al. J | 2019-01-01 |
Evaluation Apparatus And Evaluation Method
App 20180180660 - OKADA; Akira ; et al. | 2018-06-28 |
Evaluation Apparatus Of Semiconductor Device And Method Of Evaluating Semiconductor Device Using The Same
App 20180180659 - OKADA; Akira ; et al. | 2018-06-28 |
Semiconductor Device Evaluation Jig, Semiconductor Device Evaluation Apparatus, And Semiconductor Device Evaluation Method
App 20180088169 - NOGUCHI; Takaya ; et al. | 2018-03-29 |
Evaluation apparatus and probe position inspection method
Grant 9,804,197 - Takesako , et al. October 31, 2 | 2017-10-31 |
Device And Method For Inspecting Position Of Probe, And Semiconductor Evaluation Apparatus
App 20170299630 - OKADA; Akira ; et al. | 2017-10-19 |
Evaluation Apparatus And Probe Position Inspection Method
App 20170199225 - TAKESAKO; Norihiro ; et al. | 2017-07-13 |
Measuring apparatus
Grant 9,684,027 - Noguchi , et al. June 20, 2 | 2017-06-20 |
Measuring apparatus and measuring method utilizing insulating liquid
Grant 9,684,015 - Okada , et al. June 20, 2 | 2017-06-20 |
Semiconductor evaluation apparatus
Grant 9,678,143 - Okada , et al. June 13, 2 | 2017-06-13 |
Foreign matter removal device and foreign matter removal method
Grant 9,659,795 - Okada , et al. May 23, 2 | 2017-05-23 |
Evaluation Apparatus For Semiconductor Device And Evaluation Method For Semiconductor Device
App 20170138984 - NOGUCHI; Takaya ; et al. | 2017-05-18 |
Probe Position Inspection Apparatus, Semiconductor Device Inspection Apparatus And Semiconductor Device Inspection Method
App 20170102410 - TAKESAKO; Norihiro ; et al. | 2017-04-13 |
Measurement device
Grant 9,562,929 - Noguchi , et al. February 7, 2 | 2017-02-07 |
Contact-probe Type Temperature Detector, Semiconductor Device Evaluation Apparatus And Semiconductor Device Evaluating Method
App 20160377486 - YAMASHITA; Kinya ; et al. | 2016-12-29 |
Semiconductor testing jig and transfer jig for the same
Grant 9,257,316 - Okada , et al. February 9, 2 | 2016-02-09 |
Measuring Apparatus
App 20150362549 - NOGUCHI; Takaya ; et al. | 2015-12-17 |
Measuring Apparatus And Measuring Method
App 20150362527 - OKADA; Akira ; et al. | 2015-12-17 |
Measurement Device
App 20150331011 - NOGUCHI; Takaya ; et al. | 2015-11-19 |
Semiconductor cleaning device and semiconductor cleaning method
Grant 9,117,656 - Okada , et al. August 25, 2 | 2015-08-25 |
Semiconductor Evaluation Apparatus
App 20150115989 - OKADA; Akira ; et al. | 2015-04-30 |
Semiconductor Testing Jig And Transfer Jig For The Same
App 20150091599 - OKADA; Akira ; et al. | 2015-04-02 |
Test apparatus and test method
Grant 8,980,655 - Okada , et al. March 17, 2 | 2015-03-17 |
Test Apparatus And Test Method
App 20150044788 - OKADA; Akira ; et al. | 2015-02-12 |
Foreign Matter Removal Device And Foreign Matter Removal Method
App 20130192630 - OKADA; Akira ; et al. | 2013-08-01 |
Semiconductor Cleaning Device And Semiconductor Cleaning Method
App 20130152965 - OKADA; Akira ; et al. | 2013-06-20 |
Polypropylene Resin Composition, Formed Product Composed of the Resin Composition, and Production Process of the Formed Product
App 20100286317 - Sato; Hiroyuki ; et al. | 2010-11-11 |
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