Noguchi; Koichiro

Patent Applications and Registrations

Patent applications and USPTO patent grants for Noguchi; Koichiro.The latest application filed is for "semiconductor module and semiconductor package".

Company Profile

5.23.21

Noguchi; Koichiro - Tokyo JP
Noguchi; Koichiro - Kawasaki JP
NOGUCHI; Koichiro - Kawasaki-shi JP
Noguchi; Koichiro - Kanagawa N/A JP
Noguchi; Koichiro - Minato-ku N/A JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Package and terminal arrangement for semiconductor module Grant 11,069,602 - Yokoyama , et al. July 20, 2	2021-07-20
Semiconductor module and semiconductor package Grant 10,998,902 - Kawahara , et al. May 4, 2	2021-05-04
Semiconductor Module And Semiconductor Package App 20200403612 - KAWAHARA; Kazuhiro ; et al.	2020-12-24
Driving device for semiconductor element Grant 10,812,062 - Murakami , et al. October 20, 2	2020-10-20
Semiconductor Module App 20200194353 - YOKOYAMA; Shuhei ; et al.	2020-06-18
Power semiconductor device Grant 10,630,279 - Kawahara , et al.	2020-04-21
Power Semiconductor Device App 20190379370 - KAWAHARA; Kazuhiro ; et al.	2019-12-12
Driving Device For Semiconductor Element App 20190326897 - MURAKAMI; Haruhiko ; et al.	2019-10-24
Power module Grant 10,333,514 - Noguchi	2019-06-25
Semiconductor device Grant 10,305,468 - Noguchi , et al.	2019-05-28
Power Module App 20190089351 - NOGUCHI; Koichiro	2019-03-21
Power supply device, and control method of power supply device Grant 10,230,275 - Noguchi , et al.	2019-03-12
Semiconductor Device App 20180323779 - NOGUCHI; Koichiro ; et al.	2018-11-08
Semiconductor device Grant 10,033,372 - Noguchi , et al. July 24, 2	2018-07-24
Semiconductor device, semiconductor system including the same, control method of semiconductor device, and check list generation program Grant 9,965,418 - Noguchi May 8, 2	2018-05-08
Power Supply Device, And Control Method Of Power Supply Device App 20180083494 - NOGUCHI; Koichiro ; et al.	2018-03-22
Power supply circuit Grant 9,906,079 - Noguchi , et al. February 27, 2	2018-02-27
Power supply device, and control method of power supply device Grant 9,843,227 - Noguchi , et al. December 12, 2	2017-12-12
Instruction Execution Control System And Instruction Execution Control Method App 20170300329 - NOGUCHI; Koichiro ; et al.	2017-10-19
Semiconductor Device, Semiconductor System Including The Same, Control Method Of Semiconductor Device, And Check List Generation Program App 20160364351 - NOGUCHI; Koichiro	2016-12-15
Connection Relation Detecting System, Information Processing Apparatus, And Connection Relation Detecting Method App 20160132040 - NOGUCHI; Koichiro ; et al.	2016-05-12
Semiconductor Device App 20160065070 - NOGUCHI; Koichiro ; et al.	2016-03-03
Power Supply Device, And Control Method Of Power Supply Device App 20150311706 - NOGUCHI; Koichiro ; et al.	2015-10-29
Power Supply Circuit App 20150180239 - NOGUCHI; Koichiro ; et al.	2015-06-25
Control voltage generating circuit, constant current source circuit, and delay circuit and logic circuit including the same Grant 8,653,861 - Noguchi , et al. February 18, 2	2014-02-18
Semiconductor inspection apparatus, semiconductor wafer positioning method, and semiconductor wafer inspection method Grant 8,570,056 - Kameda , et al. October 29, 2	2013-10-29
Semiconductor inspecting device and semiconductor inspecting method Grant 8,536,890 - Kameda , et al. September 17, 2	2013-09-17
Semiconductor device and method of testing the same Grant 8,513,970 - Kameda , et al. August 20, 2	2013-08-20
Semiconductor testing device, semiconductor device, and testing method Grant 8,441,277 - Noguchi , et al. May 14, 2	2013-05-14
Semiconductor device Grant 8,399,960 - Nakagawa , et al. March 19, 2	2013-03-19
Control voltage generating circuit, constant current source circuit, and delay circuit and logic circuit including the same App 20120062301 - Noguchi; Koichiro ; et al.	2012-03-15
Electronic Circuit, Circuit Apparatus, Test System, Control Method Of The Electronic Circuit App 20120025790 - Noguchi; Koichiro ; et al.	2012-02-02
Semiconductor Wafer And Method For Manufacturing Semiconductor Device App 20120018726 - Nakagawa; Yoshihiro ; et al.	2012-01-26
Semiconductor Device And Method Of Testing The Same App 20110260747 - Kameda; Yoshio ; et al.	2011-10-27
Semiconductor Device App 20110012228 - Nakagawa; Yoshihiro ; et al.	2011-01-20
Semiconductor Device App 20110006443 - Noguchi; Koichiro ; et al.	2011-01-13
Semiconductor Inspecting Device And Semiconductor Inspecting Method App 20100321054 - Kameda; Yoshio ; et al.	2010-12-23
Semiconductor Testing Device, Semiconductor Device, And Testing Method App 20100283497 - Noguchi; Koichiro ; et al.	2010-11-11

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