loadpatents
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name:-0.0022280216217041
NODA; Tomoya Patent Filings

NODA; Tomoya

Patent Applications and Registrations

Patent applications and USPTO patent grants for NODA; Tomoya.The latest application filed is for "structured illuminating microscopy apparatus".

Company Profile
2.10.8
  • NODA; Tomoya - Saitama-shi JP
  • Noda; Tomoya - Saitama JP
  • Noda; Tomoya - Okazaki JP
  • NODA; Tomoya - Okazaki-shi JP
  • Noda; Tomoya - Kumagaya JP
  • Noda; Tomoya - Kamagaya-shi JP
  • Noda; Tomoya - Tokyo JP
  • Noda; Tomoya - Yokohama JP
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Structured Illuminating Microscopy Apparatus
App 20220050283 - OHKI; Hiroshi ;   et al.
2022-02-17
Structured illuminating microscopy apparatus
Grant 11,187,883 - Ohki , et al. November 30, 2
2021-11-30
Fundus image forming device
Grant 10,398,311 - Noda Sep
2019-09-03
Fundus image forming device
Grant 10,362,938 - Noda
2019-07-30
Structured Illuminating Microscopy Apparatus
App 20190196171 - OHKI; Hiroshi ;   et al.
2019-06-27
Structured illuminating microscopy apparatus
Grant 10,261,304 - Ohki , et al.
2019-04-16
Fundus Image Forming Device
App 20170347881 - NODA; Tomoya
2017-12-07
Fundus Image Forming Device
App 20170347882 - NODA; Tomoya
2017-12-07
Valve apparatus
Grant 9,670,879 - Nakano , et al. June 6, 2
2017-06-06
Valve Apparatus
App 20150300295 - NAKANO; Akira ;   et al.
2015-10-22
Structured Illuminating Microscopy Apparatus
App 20150185463 - OHKI; Hiroshi ;   et al.
2015-07-02
Semiconductor device for driving electric motor
Grant 8,648,340 - Noda , et al. February 11, 2
2014-02-11
Semiconductor Device For Driving Electric Motor
App 20120018725 - NODA; Tomoya ;   et al.
2012-01-26
Confocal microscope
Grant 7,369,309 - Ujike , et al. May 6, 2
2008-05-06
Confocal microscope
App 20070014001 - Ujike; Tomoko ;   et al.
2007-01-18
Wave surface aberration measurement device, wave surface aberration measurement method, and projection lens fabricated by the device and the method
Grant 6,693,704 - Ooki , et al. February 17, 2
2004-02-17
Laser scanning microscope utilizing detection of a far-field diffraction pattern with 2-dimensional detection
Grant 5,621,532 - Ooki , et al. April 15, 1
1997-04-15

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