Nishizawa; Mitsunori

Patent Applications and Registrations

Patent applications and USPTO patent grants for Nishizawa; Mitsunori.The latest application filed is for "light source device and inspection device".

Company Profile

2.13.11

Nishizawa; Mitsunori - Hamamatsu JP
NISHIZAWA; Mitsunori - Hamamatsu-shi Shizuoka
Nishizawa; Mitsunori - Shizuoka JP
Nishizawa; Mitsunori - Kawasaki-City JA
Nishizawa; Mitsunori - Kawasaki JA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Time measurement device, time measurement method, light-emission-lifetime measurement device, and light-emission-lifetime measurement method Grant 10,962,932 - Kitazawa , et al. March 30, 2	2021-03-30
Light source device and inspection device Grant 10,408,874 - Nakamura , et al. Sept	2019-09-10
Semiconductor device inspection device and semiconductor device inspection method Grant 10,191,104 - Nakamura , et al. Ja	2019-01-29
Image generation apparatus and image generation method Grant 10,139,447 - Nakamura , et al. Nov	2018-11-27
Semiconductor device inspection device and semiconductor device inspection method Grant 10,101,383 - Nakamura , et al. October 16, 2	2018-10-16
Light Source Device And Inspection Device App 20180156860 - NAKAMURA; Tomonori ; et al.	2018-06-07
Time Measurement Device, Time Measurement Method, Light-emission-lifetime Measurement Device, And Light-emission-lifetime Measurement Method App 20170285579 - KITAZAWA; Ken ; et al.	2017-10-05
Semiconductor Device Inspection Device And Semiconductor Device Inspection Method App 20170176521 - NAKAMURA; Tomonori ; et al.	2017-06-22
Apparatus for testing a semiconductor device and method of testing a semiconductor device Grant 9,618,576 - Otaka , et al. April 11, 2	2017-04-11
Apparatus for frequency analyzing a measurement target and method of frequency analyzing a measurement target Grant 9,618,550 - Nakamura , et al. April 11, 2	2017-04-11
Semiconductor device inspection device and semiconductor device inspection method Grant 9,562,944 - Nakamura , et al. February 7, 2	2017-02-07
Semiconductor Device Inspection Device And Semiconductor Device Inspection Method App 20160334459 - NAKAMURA; Tomonori ; et al.	2016-11-17
Semiconductor Device Inspection Device And Semiconductor Device Inspection Method App 20150377959 - NAKAMURA; Tomonori ; et al.	2015-12-31
Semiconductor Device Inspection Device And Semiconductor Device Inspection Method App 20150369755 - NAKAMURA; Tomonori ; et al.	2015-12-24
Image Generation Apparatus And Image Generation Method App 20150309115 - NAKAMURA; Tomonori ; et al.	2015-10-29
Apparatus For Testing A Semiconductor Device And Method Of Testing A Semiconductor Device App 20150153408 - OTAKA; Akihiro ; et al.	2015-06-04
Apparatus For Frequency Analyzing A Measurement Target And Method Of Frequency Analyzing A Measurement Target App 20150130474 - NAKAMURA; Tomonori ; et al.	2015-05-14
Time-resolved measurement apparatus and position-sensitive election multiplier tube Grant 7,619,199 - Hirai , et al. November 17, 2	2009-11-17
Time-resolved measurement apparatus Grant 7,425,694 - Nishizawa , et al. September 16, 2	2008-09-16
Time-Resolved Measurement Apparatus App 20070267565 - Nishizawa; Mitsunori ; et al.	2007-11-22
Time Resolution Measurement Device and Position Detection Election Multiplier App 20070263223 - Hirai; Nobuyuki ; et al.	2007-11-15
Synchronous signal detection apparatus with a photoconductive photodetector Grant 5,591,962 - Koishi , et al. January 7, 1	1997-01-07
Concentric Sales Control System And Apparatus In Fuel Supplying And Servicing Station Grant 3,632,988 - Yamawaki , et al. January 4, 1	1972-01-04
Fuel Supplying Apparatus Grant 3,603,480 - Irie , et al. September 7, 1	1971-09-07

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