Nishizaki; Craig
Patent Applications and Registrations
Patent applications and USPTO patent grants for Nishizaki; Craig.The latest application filed is for "multivariate yield calculator for wafer integrated circuit fabrication and method of use thereof".
- Nishizaki; Craig - Santa Clara CA
| Patent | Date |
|---|---|
| System and method for generating a yield forecast based on wafer acceptance tests Grant 9,207,277 - Nishizaki , et al. December 8, 2 | 2015-12-08 |
| System and method for compensating measured IDDQ values Grant 9,007,079 - Narayen , et al. April 14, 2 | 2015-04-14 |
| Multivariate Yield Calculator For Wafer Integrated Circuit Fabrication And Method Of Use Thereof App 20140358478 - Yu; Meng ; et al. | 2014-12-04 |
| System And Method For Compensating Measured Iddq Values App 20140125364 - Narayen; Dushyant ; et al. | 2014-05-08 |
| System And Method For Generating A Yield Forecast Based On Wafer Acceptance Tests App 20140122005 - Nishizaki; Craig ; et al. | 2014-05-01 |
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