NISHIURA; Tomofumi

Patent Applications and Registrations

Patent applications and USPTO patent grants for NISHIURA; Tomofumi.The latest application filed is for "medical image processing apparatus, and medical imaging apparatus".

Company Profile

1.11.15

NISHIURA; Tomofumi - Tokyo JP
Nishiura; Tomofumi - Mitaka JP
NISHIURA; Tomofumi - Mitaka-shi JP
Nishiura; Tomofumi - Kawasaki JP
Nishiura; Tomofumi - Yokohama JP
Nishiura; Tomofumi - Kanagawa JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Medical Image Processing Apparatus, And Medical Imaging Apparatus App 20210366120 - ITO; Nao ; et al.	2021-11-25
Medical Image Processing Apparatus And Medical Image Processing Method App 20210241886 - NOGUCHI; Yoshimi ; et al.	2021-08-05
Ultrasound Diagnosis Apparatus And Program App 20210212660 - Nishiura; Tomofumi	2021-07-15
Ultrasonic Imaging Device And Image Processing Device App 20200320750 - YAMANAKA; Kazuhiro ; et al.	2020-10-08
Medical diagnosis device and measurement method thereof Grant 9,913,625 - Chono , et al. March 13, 2	2018-03-13
Medical imaging apparatus and method of constructing medical images Grant 9,342,922 - Nishiura May 17, 2	2016-05-17
Ultrasonic Imaging Apparatus And Ultrasound Image Display Method App 20160007972 - NISHIURA; Tomofumi	2016-01-14
Medical Diagnosis Device And Measurement Method Thereof App 20150320399 - Chono; Tomoaki ; et al.	2015-11-12
Medical Imaging Apparatus And Method Of Constructing Medical Images App 20140152661 - Nishiura; Tomofumi	2014-06-05
Charged particle beam device Grant 8,357,897 - Shishido , et al. January 22, 2	2013-01-22
Method and apparatus for inspecting defect of pattern formed on semiconductor device Grant 8,331,651 - Nishiura , et al. December 11, 2	2012-12-11
Method and apparatus for measuring dimension of circuit pattern formed on substrate by using scanning electron microscope Grant 8,283,630 - Miyamoto , et al. October 9, 2	2012-10-09
Charged Particle Beam Device App 20120104254 - Shishido; Chie ; et al.	2012-05-03
Method and Apparatus For Inspecting Defect Of Pattern Formed On Semiconductor Device App 20120002861 - Nishiura; Tomofumi ; et al.	2012-01-05
SEM system and a method for producing a recipe Grant 8,073,242 - Miyamoto , et al. December 6, 2	2011-12-06
Method and apparatus for inspecting defect of pattern formed on semiconductor device Grant 8,045,789 - Nishiura , et al. October 25, 2	2011-10-25
Method and Apparatus For Measuring Dimension Of Circuit Pattern Formed On Substrate By Using Scanning Electron Microscope App 20110127429 - Miyamoto; Atsushi ; et al.	2011-06-02
Method and apparatus for measuring dimension of circuit pattern formed on substrate by using scanning electron microscope Grant 7,888,638 - Miyamoto , et al. February 15, 2	2011-02-15
Method and Apparatus for Measuring Dimension of Circuit Patterm Formed on Substrate by Using Scanning Electron Microscope App 20090242760 - Miyamoto; Atsushi ; et al.	2009-10-01
Method And Apparatus For Inspecting Defect Of Pattern Formed On Semiconductor Device App 20090208090 - NISHIURA; Tomofumi ; et al.	2009-08-20
Condition-analyzing device Grant 7,545,279 - Sato , et al. June 9, 2	2009-06-09
Sem System And A Method For Producing A Recipe For Imaging Or Measuring A Specimen By Using The Sem System App 20080159609 - Miyamoto; Atsushi ; et al.	2008-07-03
Condition-analyzing device App 20060279428 - Sato; Isao ; et al.	2006-12-14

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