Nishiura; Junji
Patent Applications and Registrations
Patent applications and USPTO patent grants for Nishiura; Junji.The latest application filed is for "ic test apparatus".
- Nishiura; Junji - Gyoda JP
- Nishiura; Junji - Saitama
| Patent | Date |
|---|---|
| IC test apparatus Grant 5,241,264 - Nishiura August 31, 1 | 1993-08-31 |
| High speed circuit testing apparatus having plural test conditions Grant 4,862,071 - Sato , et al. August 29, 1 | 1989-08-29 |
| Semiconductor memory test system Grant 4,835,774 - Ooshima , et al. May 30, 1 | 1989-05-30 |
| Counter-address memory for multi-channel timing signals Grant 4,553,100 - Nishiura November 12, 1 | 1985-11-12 |
| Logic test system permitting test pattern changes without dummy cycles Grant 4,313,200 - Nishiura January 26, 1 | 1982-01-26 |
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