NISHIOKA; Tadashi

Patent Applications and Registrations

Patent applications and USPTO patent grants for NISHIOKA; Tadashi.The latest application filed is for "method for manufacturing display device".

Company Profile

3.15.5

NISHIOKA; Tadashi - Sakai City Osaka
Nishioka; Tadashi - Osaka JP
Nishioka; Tadashi - Hyogo JP
Nishioka; Tadashi - Itami JP
Nishioka; Tadashi - Tenri JP
Nishioka; Tadashi - Itami City JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method For Manufacturing Display Device App 20220158145 - YAMAGUCHI; KATSUHIRO ; et al.	2022-05-19
Film Applying Apparatus App 20190358945 - NISHIOKA; Tadashi	2019-11-28
Bonding Method And Coating Device App 20190280208 - YAMAGUCHI; Katsuhiro ; et al.	2019-09-12
Transport Tool And Method For Manufacturing Organic Electroluminescent Display Device Using Said Transport Tool App 20190207170 - YAMAGUCHI; Katsuhiro ; et al.	2019-07-04
Device For Fabricating Liquid Crystal Display And Method For Fabricating Liquid Crystal Display App 20120067500 - Nishioka; Tadashi	2012-03-22
Method of using scanning probe microscope allowing cleaning of probe tip in ambient atmosphere Grant 5,652,428 - Nishioka , et al. July 29, 1	1997-07-29
Method of forming fine patterns Grant 5,595,941 - Okamoto , et al. January 21, 1	1997-01-21
Cantilever for atomic force microscope and method of manufacturing the cantilever Grant 5,469,733 - Yasue , et al. November 28, 1	1995-11-28
Semiconductor wafer inspection apparatus Grant 5,465,145 - Nakashige , et al. November 7, 1	1995-11-07
Liquid crystal display device, method of correcting defective pixels, and defective-pixel correcting apparatus used therein Grant 5,267,066 - Nakai , et al. November 30, 1	1993-11-30
Cantilever for use in atomic force microscope and manufacturing method therefor Grant 5,193,385 - Nishioka , et al. March 16, 1	1993-03-16
Fine scanning mechanism for atomic force microscope Grant 5,107,114 - Nishioka , et al. April 21, 1	1992-04-21
Process for forming electrodes for semiconductor devices using focused ion beam deposition Grant 4,962,059 - Nishioka , et al. October 9, 1	1990-10-09
Method for repairing a pattern Grant 4,952,421 - Morimoto , et al. August 28, 1	1990-08-28
Tunnel unit and scanning head for scanning tunneling microscope Grant 4,947,042 - Nishioka , et al. August 7, 1	1990-08-07
Fine adjustment mechanism for a scanning tunneling microscope Grant 4,880,975 - Nishioka , et al. November 14, 1	1989-11-14
Process for forming electrodes for semiconductor devices using focused ion beams Grant 4,853,341 - Nishioka , et al. August 1, 1	1989-08-01
Coarse adjusting device of scanning tunneling microscope Grant 4,837,445 - Nishioka , et al. June 6, 1	1989-06-06
Aluminum circuit to be disconnected and method of cutting the same Grant 4,691,078 - Nishioka , et al. September 1, 1	1987-09-01
Method of mounting a semiconductor element for analyzing failures thereon Grant 4,431,967 - Nishioka February 14, 1	1984-02-14

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