Patent | Date |
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TSV auto repair scheme on stacked die Grant 11,380,414 - Nishioka July 5, 2 | 2022-07-05 |
Plurality of edge through-silicon vias and related systems, methods, and devices Grant 11,275,111 - Nishioka March 15, 2 | 2022-03-15 |
Memory core chip having TSVs Grant 11,244,888 - Nishioka , et al. February 8, 2 | 2022-02-08 |
TSV Auto Repair Scheme On Stacked Die App 20210193242 - Nishioka; Naohisa | 2021-06-24 |
Memory Core Chip Having TSVS App 20210183744 - Nishioka; Naohisa ;   et al. | 2021-06-17 |
Apparatuses and methods for TSV resistance and short measurement in a stacked device Grant 11,037,843 - Nishioka June 15, 2 | 2021-06-15 |
Plurality Of Edge Through-silicon Vias And Related Systems, Methods, And Devices App 20210088586 - Nishioka; Naohisa | 2021-03-25 |
TSV auto repair scheme on stacked die Grant 10,930,363 - Nishioka February 23, 2 | 2021-02-23 |
Memory core chip having TSVS Grant 10,916,489 - Nishioka , et al. February 9, 2 | 2021-02-09 |
Apparatuses And Methods For Tsv Resistance And Short Measurement In A Stacked Device App 20200051876 - Nishioka; Naohisa | 2020-02-13 |
Apparatuses and methods for TSV resistance and short measurement in a stacked device Grant 10,468,313 - Nishioka No | 2019-11-05 |
Apparatuses And Methods For Tsv Resistance And Short Measurement In A Stacked Device App 20190096776 - Nishioka; Naohisa | 2019-03-28 |
Semiconductor device, adjustment method thereof and data processing system Grant 10,181,347 - Nishioka , et al. Ja | 2019-01-15 |
Semiconductor Device, Adjustment Method Thereof And Data Processing System App 20170148498 - Nishioka; Naohisa ;   et al. | 2017-05-25 |
Semiconductor device and test method thereof Grant 9,312,031 - Nishioka April 12, 2 | 2016-04-12 |
Semiconductor device Grant 9,281,076 - Nishioka March 8, 2 | 2016-03-08 |
Semiconductor Device, Adjustment Method Thereof And Data Processing System App 20150262648 - Nishioka; Naohisa ;   et al. | 2015-09-17 |
Semiconductor memory device, method of adjusting the same and information processing system including the same Grant 9,087,571 - Yoko , et al. July 21, 2 | 2015-07-21 |
Semiconductor device, adjustment method thereof and data processing system Grant 9,047,989 - Nishioka , et al. June 2, 2 | 2015-06-02 |
Semiconductor device and test method thereof Grant 8,981,808 - Nishioka March 17, 2 | 2015-03-17 |
Semiconductor Device and Test Method Thereof App 20140369145 - Nishioka; Naohisa | 2014-12-18 |
Semiconductor device, control method for the semiconductor device and information processing system including the same Grant 8,904,071 - Kondo , et al. December 2, 2 | 2014-12-02 |
Semiconductor device and test method thereof Grant 8,848,473 - Nishioka September 30, 2 | 2014-09-30 |
Semiconductor Device, Adjustment Method Thereof And Data Processing System App 20140165018 - NISHIOKA; Naohisa ;   et al. | 2014-06-12 |
Semiconductor Device App 20140140160 - Nishioka; Naohisa | 2014-05-22 |
Semiconductor Device, Control Method For The Semiconductor Device And Information Processing System Including The Same App 20140089723 - KONDO; Chikara ;   et al. | 2014-03-27 |
Semiconductor Device And Test Method Thereof App 20140078843 - Nishioka; Naohisa | 2014-03-20 |
Semiconductor device, adjustment method thereof and data processing system Grant 8,677,294 - Nishioka , et al. March 18, 2 | 2014-03-18 |
Semiconductor Memory Device, Method Of Adjusting The Same And Information Processing System Including The Same App 20140056086 - Yoko; Hideyuki ;   et al. | 2014-02-27 |
Semiconductor device Grant 8,638,631 - Nishioka January 28, 2 | 2014-01-28 |
Semiconductor Device, Adjustment Method Thereof And Data Processing System App 20140016388 - NISHIOKA; Naohisa ;   et al. | 2014-01-16 |
Semiconductor device, control method for the semiconductor device and information processing system including the same Grant 8,601,188 - Kondo , et al. December 3, 2 | 2013-12-03 |
Semiconductor memory device, method of adjusting the same and information processing system including the same Grant 8,599,641 - Yoko , et al. December 3, 2 | 2013-12-03 |
Semiconductor device and test method thereof Grant 8,593,891 - Nishioka November 26, 2 | 2013-11-26 |
Semiconductor Device, Control Method For The Semiconductor Device And Information Processing System Including The Same App 20130275798 - KONDO; Chikara ;   et al. | 2013-10-17 |
Semiconductor device, adjustment method thereof and data processing system Grant 8,539,410 - Nishioka , et al. September 17, 2 | 2013-09-17 |
Semiconductor device, control method for the semiconductor device and information processing system including the same Grant 8,473,653 - Kondo , et al. June 25, 2 | 2013-06-25 |
Semiconductor device, adjustment method thereof and data processing system Grant 8,381,157 - Nishioka , et al. February 19, 2 | 2013-02-19 |
Semiconductor Device, Adjustment Method Thereof And Data Processing System App 20130010515 - NISHIOKA; Naohisa ;   et al. | 2013-01-10 |
Semiconductor device, adjustment method thereof and data processing system Grant 8,239,812 - Nishioka , et al. August 7, 2 | 2012-08-07 |
Semiconductor Device, Adjustment Method Thereof And Data Processing System App 20120127812 - NISHIOKA; Naohisa ;   et al. | 2012-05-24 |
Semiconductor device and test method thereof App 20120092943 - Nishioka; Naohisa | 2012-04-19 |
Semiconductor memory device, method of adjusting the same and information processing system including the same App 20110093735 - Yoko; Hideyuki ;   et al. | 2011-04-21 |
Semiconductor device and test method thereof App 20110084722 - Nishioka; Naohisa | 2011-04-14 |
Semiconductor device, adjustment method thereof and data processing system App 20110084744 - Nishioka; Naohisa ;   et al. | 2011-04-14 |
Semiconductor memory device and information processing system including the same App 20110085403 - Nishioka; Naohisa | 2011-04-14 |
Semiconductor device, control method for the semiconductor device and information processing system including the same App 20110087811 - Kondo; Chikara ;   et al. | 2011-04-14 |
Semiconductor memory device capable of relieving defective bits found after packaging Grant 7,835,206 - Nishioka November 16, 2 | 2010-11-16 |
Semiconductor Device App 20100109683 - NISHIOKA; Naohisa | 2010-05-06 |
Fuse circuit and semiconductor device using fuse circuit thereof Grant 7,436,729 - Yoshida , et al. October 14, 2 | 2008-10-14 |
Semiconductor memory device and method of adjusting same Grant 7,411,852 - Nishioka , et al. August 12, 2 | 2008-08-12 |
Semiconductor memory device and method of adjusting same App 20070097773 - Nishioka; Naohisa ;   et al. | 2007-05-03 |
Fuse circuit and semiconductor device using fuse circuit thereof App 20060072364 - Yoshida; Hiroyasu ;   et al. | 2006-04-06 |
Semiconductor device App 20020024881 - Nishioka, Naohisa | 2002-02-28 |
Semiconductor memory and method of saving energy of the memory App 20010026488 - Nishioka, Naohisa | 2001-10-04 |