Nishino; Teruhide
Patent Applications and Registrations
Patent applications and USPTO patent grants for Nishino; Teruhide.The latest application filed is for "substrate processing apparatus, recording medium, and method of processing substrates".
- Nishino; Teruhide - Kawasaki JP
- NISHINO; Teruhide - Kawasaki-shi JP
- Nishino; Teruhide - Yokohama JP
- Nishino; Teruhide - Yokohama-shi JP
| Patent | Date |
|---|---|
| Substrate processing apparatus, recording medium, and method of processing substrates Grant 10,822,698 - Nishino November 3, 2 | 2020-11-03 |
| Substrate Processing Apparatus, Recording Medium, And Method Of Processing Substrates App 20170057094 - NISHINO; Teruhide | 2017-03-02 |
| Semiconductor-processing apparatus equipped with robot diagnostic module Grant 8,666,551 - Takizawa , et al. March 4, 2 | 2014-03-04 |
| Semiconductor manufacturing apparatus equipped with wafer inspection device and inspection techniques Grant 7,832,353 - Takizawa , et al. November 16, 2 | 2010-11-16 |
| Semiconductor-processing Apparatus Equipped With Robot Diagnostic Module App 20100158644 - Takizawa; Masahiro ; et al. | 2010-06-24 |
| Semiconductor Manufacturing Apparatus Equipped With Wafer Inspection Device And Inspection Techniques App 20100049353 - Takizawa; Masahiro ; et al. | 2010-02-25 |
| Semiconductor Processing Apparatus Having All-round Type Wafer Handling Chamber App 20100014945 - Takizawa; Masahiro ; et al. | 2010-01-21 |
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