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Nishino; Takahiro Patent Filings

Nishino; Takahiro

Patent Applications and Registrations

Patent applications and USPTO patent grants for Nishino; Takahiro.The latest application filed is for "raw material particle size distribution measuring apparatus, particle size distribution measuring method, and porosity measuring apparatus".

Company Profile
2.3.3
  • Nishino; Takahiro - Tokyo JP
  • Nishino; Takahiro - Chiyoda-ku Tokyo
  • Nishino; Takahiro - Mie JP
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Fine ratio measuring device and fine ratio measuring system
Grant 11,403,747 - Yamahira , et al. August 2, 2
2022-08-02
Raw material particle size distribution measuring apparatus, particle size distribution measuring method, and porosity measuring apparatus
Grant 11,391,662 - Yamahira , et al. July 19, 2
2022-07-19
Raw Material Particle Size Distribution Measuring Apparatus, Particle Size Distribution Measuring Method, And Porosity Measuring Apparatus
App 20210102885 - Yamahira; Naoshi ;   et al.
2021-04-08
Fine Ratio Measuring Device And Fine Ratio Measuring System
App 20190370953 - Yamahira; Naoshi ;   et al.
2019-12-05
Color display device
Grant 6,741,305 - Nakagawa , et al. May 25, 2
2004-05-25
Color display device
App 20030160916 - Nakagawa, Hidetoshi ;   et al.
2003-08-28

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