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name:-0.018957853317261
name:-0.012389898300171
name:-0.00069212913513184
Nishina; Akira Patent Filings

Nishina; Akira

Patent Applications and Registrations

Patent applications and USPTO patent grants for Nishina; Akira.The latest application filed is for "method and an apparatus for analyzing trace impurities in gases".

Company Profile
0.5.6
  • Nishina; Akira - Tokyo JP
  • Nishina, Akira - Minato-ku JP
  • Nishina; Akira - Otsu JA
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Method and an apparatus for analyzing trace impurities in gases
Grant 6,653,144 - Nishina , et al. November 25, 2
2003-11-25
Method and an apparatus for analyzing trace impurities in gases
App 20030092193 - Nishina, Akira ;   et al.
2003-05-15
Method and an apparatus for analyzing trace impurities in gases
App 20030086826 - Nishina, Akira ;   et al.
2003-05-08
Apparatus and process for supplying gas
Grant 6,523,567 - Satou , et al. February 25, 2
2003-02-25
Method and apparatus for analyzing impurities in gases
Grant 6,474,136 - Nishina , et al. November 5, 2
2002-11-05
Apparatus and process for supplying gas
App 20020117222 - Satou, Tetsuya ;   et al.
2002-08-29
Gas analyzing apparatus
App 20020108429 - Kikuchi, Tsutomu ;   et al.
2002-08-15
System and process for analysis
App 20020111747 - Nishina, Akira ;   et al.
2002-08-15
Gas Analyzing Apparatus
App 20020062680 - Kikuchi, Tsutomu ;   et al.
2002-05-30
Multi-gas analysis system for analyzing high-purity gases
Grant 6,324,892 - Nishina , et al. December 4, 2
2001-12-04
Method Of And Apparatus For Injecting Fuel Into A Diesel Engine
Grant 3,722,490 - Araya , et al. March 27, 1
1973-03-27

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