Nishikawa; Yuya

Patent Applications and Registrations

Patent applications and USPTO patent grants for Nishikawa; Yuya.The latest application filed is for "measurement apparatus for measuring shape of target object, system and manufacturing method".

Company Profile

0.3.8

Nishikawa; Yuya - Utsunomiya JP
Nishikawa; Yuya - Utsunomiya-shi JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Measuring apparatus, measuring method, and article manufacturing method Grant 10,228,239 - Nishikawa	2019-03-12
Measurement Apparatus For Measuring Shape Of Target Object, System And Manufacturing Method App 20180195858 - Nishikawa; Yuya	2018-07-12
Measurement apparatus Grant 10,018,722 - Nishikawa , et al. July 10, 2	2018-07-10
Measurement Apparatus, Measurement Method, And Article Manufacturing Method App 20170287156 - Nishikawa; Yuya	2017-10-05
Measuring Apparatus, Measuring Method, And Article Manufacturing Method App 20170160078 - Nishikawa; Yuya	2017-06-08
Measurement Apparatus App 20160266255 - Nishikawa; Yuya ; et al.	2016-09-15
Measurement apparatus for measuring shape of test object and measurement method Grant 9,052,189 - Nishikawa June 9, 2	2015-06-09
Measurement Apparatus And Measurement Method App 20140182150 - Nishikawa; Yuya ; et al.	2014-07-03
Interference Measuring Apparatus And Interference Measuring Method App 20140160490 - Nishikawa; Yuya	2014-06-12
Measurement Apparatus For Measuring Shape Of Test Object And Measurement Method App 20130229664 - Nishikawa; Yuya	2013-09-05
Measurement Apparatus App 20130107242 - Nishikawa; Yuya	2013-05-02

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