NISHIHAMA; Hiroshi
Patent Applications and Registrations
Patent applications and USPTO patent grants for NISHIHAMA; Hiroshi.The latest application filed is for "charged particle beam device".
- NISHIHAMA; Hiroshi - Tokyo JP
- Nishihama; Hiroshi - Hitachinaka JP
- - Hitachinaka JP
| Patent | Date |
|---|---|
| Charged Particle Beam Device App 20220165537 - HOMMI; Motonobu ; et al. | 2022-05-26 |
| Charged particle beam apparatus Grant 10,755,890 - Ueno , et al. A | 2020-08-25 |
| Charged particle beam device Grant 10,546,715 - Hoque , et al. Ja | 2020-01-28 |
| Charged Particle Beam Apparatus App 20180286627 - UENO; Shinya ; et al. | 2018-10-04 |
| Charged Particle Beam Device App 20180269026 - HOQUE; Shahedul ; et al. | 2018-09-20 |
| Pattern measuring apparatus Grant 8,872,106 - Nishihama , et al. October 28, 2 | 2014-10-28 |
| Pattern Measuring Apparatus App 20140021350 - NISHIHAMA; Hiroshi ; et al. | 2014-01-23 |
| Pattern Measuring Apparatus App 20140021349 - Nishihama; Hiroshi ; et al. | 2014-01-23 |
| Pattern measuring apparatus Grant 08618517 - | 2013-12-31 |
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