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Patent applications and USPTO patent grants for Nir; Zvi.The latest application filed is for "charged particle beam device, charged particle beam influencing device, and method of operating a charged particle beam device".
Patent | Date |
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System and method for scanning an object with an electron beam using overlapping scans and electron beam counter-deflection Grant 10,541,104 - Lev , et al. Ja | 2020-01-21 |
Charged particle beam device, charged particle beam influencing device, and method of operating a charged particle beam device Grant 10,249,472 - Winkler , et al. | 2019-04-02 |
Charged Particle Beam Device, Charged Particle Beam Influencing Device, And Method Of Operating A Charged Particle Beam Device App 20190019649 - Winkler; Dieter ;   et al. | 2019-01-17 |
System And Method For Scanning An Object With An Electron Beam App 20170011883 - Lev; Uri ;   et al. | 2017-01-12 |
Pattern invariant focusing of a charged particle beam Grant 7,759,642 - Nir July 20, 2 | 2010-07-20 |
Pattern Invariant Focusing of a Charged Particle Beam App 20090272900 - Nir; Zvi | 2009-11-05 |
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