Ninomiya; Takanori

Patent Applications and Registrations

Patent applications and USPTO patent grants for Ninomiya; Takanori.The latest application filed is for "power module, power converter device, and electrically powered vehicle".

Company Profile

2.66.38

Ninomiya; Takanori - Hiratsuka JP
NINOMIYA; Takanori - Hiratsuka-shi JP
Ninomiya; Takanori - Tokyo JP
Ninomiya; Takanori - Kariya N/A JP
Ninomiya; Takanori - Fujimi-machi JP
Ninomiya; Takanori - Kanagawa JP
Ninomiya; Takanori - Kanagawa-Ken JP
Ninomiya; Takanori - Suwa-gun JP
Ninomiya; Takanori - Kariya-shi JP
Ninomiya; Takanori - Hitachinaka JP
Ninomiya; Takanori - Goten 1-30-21 Hiratsuka-shi JP
Ninomiya; Takanori - Yokohama JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Power module, power converter device, and electrically powered vehicle Grant 11,139,748 - Nakatsu , et al. October 5, 2	2021-10-05
Power Module, Power Converter Device, and Electrically Powered Vehicle App 20190393799 - NAKATSU; Kinya ; et al.	2019-12-26
Power module, power converter device, and electrically powered vehicle Grant 10,348,214 - Nakatsu , et al. July 9, 2	2019-07-09
Power Module, Power Converter Device, and Electrically Powered Vehicle App 20170302191 - NAKATSU; Kinya ; et al.	2017-10-19
Power module, power converter device, and electrically powered vehicle Grant 9,729,076 - Nakatsu , et al. August 8, 2	2017-08-08
Power Module, Power Converter Device, and Electrically Powered Vehicle App 20160308456 - NAKATSU; Kinya ; et al.	2016-10-20
Power module, power converter device, and electrically powered vehicle Grant 9,407,163 - Nakatsu , et al. August 2, 2	2016-08-02
Power Module, Power Converter Device, and Electrically Powered Vehicle App 20160149512 - NAKATSU; Kinya ; et al.	2016-05-26
Power module, power converter device, and electrically powered vehicle Grant 8,946,567 - Nakatsu , et al. February 3, 2	2015-02-03
Consumer Energy Management System And Consumer Energy Management Method App 20140316599 - Tomita; Yasushi ; et al.	2014-10-23
Roller shade apparatus for vehicle Grant 8,590,593 - Kitani , et al. November 26, 2	2013-11-26
Method of inspecting a semiconductor device and an apparatus thereof Grant 8,559,000 - Hamamatsu , et al. October 15, 2	2013-10-15
Method Of Inspecting A Semiconductor Device And An Apparatus Thereof App 20120312104 - HAMAMATSU; Akira ; et al.	2012-12-13
Method of inspecting a semiconductor device and an apparatus thereof Grant 8,274,651 - Hamamatsu , et al. September 25, 2	2012-09-25
Electro-optic device and an electronic apparatus Grant 8,132,926 - Ninomiya March 13, 2	2012-03-13
Method Of Inspecting A Semiconductor Device And An Apparatus Thereof App 20120006131 - Hamamatsu; Akira ; et al.	2012-01-12
Power Module, Power Converter Device, and Electrically Powered Vehicle App 20110299265 - Nakatsu; Kinya ; et al.	2011-12-08
Method of inspecting a semiconductor device and an apparatus thereof Grant 8,040,503 - Hamamatsu , et al. October 18, 2	2011-10-18
Method for determining the morphology of an occupant in an automotive seat with capacitive sensors Grant 7,987,033 - Launay , et al. July 26, 2	2011-07-26
Method using capacitive sensors for morphology discrimination of a passenger seating in an automotive seat Grant 7,962,311 - Launay , et al. June 14, 2	2011-06-14
Method of detecting defects on an object Grant 7,940,383 - Noguchi , et al. May 10, 2	2011-05-10
Method for improving the localisation of a target in regard of a sensor Grant 7,895,014 - Launay , et al. February 22, 2	2011-02-22
Liquid crystal device and projector Grant 7,864,277 - Ninomiya , et al. January 4, 2	2011-01-04
Roller shade apparatus for vehicle App 20100326607 - Kitani; Takashi ; et al.	2010-12-30
Electro-optic Device And An Electronic Apparatus App 20100165461 - Ninomiya; Takanori	2010-07-01
Apparatus And Method For Testing Defects App 20100088042 - NOGUCHI; Minori ; et al.	2010-04-08
Apparatus and method for testing defects Grant 7,692,779 - Noguchi , et al. April 6, 2	2010-04-06
Liquid crystal device and electronic apparatus Grant 7,671,948 - Ninomiya March 2, 2	2010-03-02
Method of inspecting a semiconductor device and an apparatus thereof Grant 7,643,138 - Hamamatsu , et al. January 5, 2	2010-01-05
Apparatus and method for testing defects Grant 7,639,350 - Noguchi , et al. December 29, 2	2009-12-29
NMR probe and NMR spectrometer Grant 7,619,414 - Yamamoto , et al. November 17, 2	2009-11-17
Liquid Crystal Device And Projector App 20090231499 - Ninomiya; Takanori ; et al.	2009-09-17
Method for inspecting defect and system therefor Grant 7,558,683 - Ninomiya , et al. July 7, 2	2009-07-07
Method for determining the morphology of an occupant in an automotive seat with capacitive sensors App 20090088929 - Launay; Claude ; et al.	2009-04-02
Method Of Inspecting A Semiconductor Device And An Apparatus Thereof App 20080291437 - Hamamatsu; Akira ; et al.	2008-11-27
Apparatus and method for testing defects Grant 7,443,496 - Noguchi , et al. October 28, 2	2008-10-28
Method of inspecting a semiconductor device and an apparatus thereof Grant 7,417,723 - Hamamatsu , et al. August 26, 2	2008-08-26
Method of inspecting a circuit pattern and inspecting instrument Grant 7,397,031 - Shinada , et al. July 8, 2	2008-07-08
Nmr Probe And Nmr Spectrometer App 20080111548 - Yamamoto; Hiroyuki ; et al.	2008-05-15
Liquid crystal device and electronic apparatus App 20080079879 - Ninomiya; Takanori	2008-04-03
Liquid crystal device and electronic apparatus App 20080068546 - Ninomiya; Takanori ; et al.	2008-03-20
Method for inspecting defect and system therefor App 20080059083 - Ninomiya; Takanori ; et al.	2008-03-06
Method for improving the localisation of a target in regard of a sensor App 20080033691 - Launay; Claude ; et al.	2008-02-07
Method using capacitive sensors for morphology discrimination of a passenger seating in an automotive seat App 20080021650 - Launay; Claude ; et al.	2008-01-24
Method for inspecting defect and system therefor Grant 7,305,314 - Ninomiya , et al. December 4, 2	2007-12-04
Pattern inspecting method and apparatus thereof, and pattern inspecting method on basis of electron beam images and apparatus thereof Grant 7,263,216 - Shishido , et al. August 28, 2	2007-08-28
Apparatus And Method For Testing Defects App 20070146696 - Noguchi; Minori ; et al.	2007-06-28
Apparatus And Method For Testing Defects App 20070146697 - Noguchi; Minori ; et al.	2007-06-28
Method of inspecting a circuit pattern and inspecting instrument App 20060243908 - Shinada; Hiroyuki ; et al.	2006-11-02
Method of inspecting a semiconductor device and an apparatus thereof App 20060215153 - Hamamatsu; Akira ; et al.	2006-09-28
Method of inspecting a circuit pattern and inspecting instrument Grant 7,098,455 - Shinada , et al. August 29, 2	2006-08-29
Apparatus and method for testing defects Grant 7,098,055 - Noguchi , et al. August 29, 2	2006-08-29
Method of inspecting a semiconductor device and an apparatus thereof Grant 7,061,602 - Hamamatsu , et al. June 13, 2	2006-06-13
Method for inspecting defect and system therefor App 20060100804 - Ninomiya; Takanori ; et al.	2006-05-11
Apparatus and method for testing defects Grant 7,037,735 - Noguchi , et al. May 2, 2	2006-05-02
Method for inspecting defect and system therefor Grant 7,010,447 - Ninomiya , et al. March 7, 2	2006-03-07
Apparatus and method for testing defects App 20060030059 - Noguchi; Minori ; et al.	2006-02-09
Apparatus and method for testing defects App 20060030060 - Noguchi; Minori ; et al.	2006-02-09
Method of inspecting a semiconductor device and an apparatus thereof App 20050196033 - Hamamatsu, Akira ; et al.	2005-09-08
Method of inspecting a semiconductor device and an apparatus thereof Grant 6,888,959 - Hamamatsu , et al. May 3, 2	2005-05-03
Information media using information of defect in an article App 20050041836 - Takeda, Kazuo ; et al.	2005-02-24
Method for inspecting defect and system therefor App 20040260496 - Ninomiya, Takanori ; et al.	2004-12-23
Thin film thickness measuring method and apparatus, and method and apparatus for manufacturing a thin film device using the same Grant 6,806,970 - Hirose , et al. October 19, 2	2004-10-19
Method for inspecting defect and system therefor Grant 6,792,359 - Ninomiya , et al. September 14, 2	2004-09-14
Identification method for an article using crystal defects Grant 6,760,472 - Takeda , et al. July 6, 2	2004-07-06
Thin film thickness measuring method and apparatus, and method and apparatus for manufacturing a thin film device using the same Grant 6,753,972 - Hirose , et al. June 22, 2	2004-06-22
Pattern inspecting method and apparatus thereof, and pattern inspecting method on basis of electron beam images and apparatus thereof App 20040086170 - Shishido, Chie ; et al.	2004-05-06
Apparatus and method for inspecting defects Grant 6,654,112 - Noguchi , et al. November 25, 2	2003-11-25
Method of inspecting a circuit pattern and inspecting instrument App 20030201391 - Shinada, Hiroyuki ; et al.	2003-10-30
Pattern inspecting method and apparatus thereof, and pattern inspecting method on basis of electron beam images and apparatus thereof Grant 6,614,923 - Shishido , et al. September 2, 2	2003-09-02
Method of inspecting a circuit pattern and inspecting instrument Grant 6,583,413 - Shinada , et al. June 24, 2	2003-06-24
Semiconductor manufacturing methods, plasma processing methods and plasma processing apparatuses Grant 6,576,559 - Nakata , et al. June 10, 2	2003-06-10
Apparatus and method for inspecting defects App 20020154297 - Noguchi, Minori ; et al.	2002-10-24
Semiconductor manufacturing methods, plasma processing methods and plasma processing apparatuses App 20020094685 - Nakata, Toshihiko ; et al.	2002-07-18
Optical apparatus for defect and particle size inspection Grant 6,411,377 - Noguchi , et al. June 25, 2	2002-06-25
Method of inspecting a pattern on a substrate Grant 6,376,854 - Shishido , et al. April 23, 2	2002-04-23
Method for inspecting defect and system therefor App 20020035435 - Ninomiya, Takanori ; et al.	2002-03-21
Method of inspecting a semiconductor device and an apparatus thereof App 20010048761 - Hamamatsu, Akira ; et al.	2001-12-06
Method of inspecting pattern and apparatus thereof App 20010030300 - Shishido, Chie ; et al.	2001-10-18
Method of inspecting pattern and apparatus thereof with a differential brightness image detection Grant 6,236,057 - Shishido , et al. May 22, 2	2001-05-22
Resolving power evaluation method and specimen for electron microscope Grant 6,166,380 - Kitagawa , et al. December 26, 2	2000-12-26
Grinding wheel Grant 6,086,467 - Imai , et al. July 11, 2	2000-07-11
Method of inspecting pattern and apparatus thereof Grant 6,087,673 - Shishido , et al. July 11, 2	2000-07-11
Method and device for detecting end point of plasma treatment, method and device for manufacturing semiconductor device, and semiconductor device Grant 5,989,928 - Nakata , et al. November 23, 1	1999-11-23
Method and apparatus for inspecting defects of surface shape Grant 5,973,777 - Nomoto , et al. October 26, 1	1999-10-26
Wiring pattern inspecting method and system for carrying out the same Grant 5,930,382 - Irie , et al. July 27, 1	1999-07-27
Method and apparatus for inspection and correction of wiring of electronic circuit and for manufacture thereof Grant 5,883,437 - Maruyama , et al. March 16, 1	1999-03-16
Method and apparatus for detecting photoacoustic signal to detect surface and subsurface information of the specimen Grant 5,781,294 - Nakata , et al. July 14, 1	1998-07-14
Method and apparatus for detecting photoacoustic signal Grant 5,479,259 - Nakata , et al. December 26, 1	1995-12-26
Method and apparatus for measuring the size of a circuit or wiring pattern formed on a hybrid integrated circuit chip and a wiring board respectively Grant 5,459,794 - Ninomiya , et al. October 17, 1	1995-10-17
Method of and apparatus for inspection of external appearance of a circuit substrate, and for displaying abnormality information thereof Grant 5,440,649 - Kiyasu , et al. August 8, 1	1995-08-08
Method for producing thin film multilayer substrate, and method and apparatus for detecting circuit conductor pattern of the substrate Grant 5,278,012 - Yamanaka , et al. January 11, 1	1994-01-11
Method for inspecting filled state of via-holes filled with fillers and apparatus for carrying out the method Grant 5,015,097 - Nomoto , et al. May 14, 1	1991-05-14
Pattern defects detection method and apparatus Grant 4,953,224 - Ichinose , et al. August 28, 1	1990-08-28
Method of and apparatus for checking geometry of multi-layer patterns for IC structures Grant 4,791,586 - Maeda , et al. December 13, 1	1988-12-13
Apparatus and method for inspecting soldered portions Grant 4,772,125 - Yoshimura , et al. September 20, 1	1988-09-20
Method and apparatus for detecting defects of printed circuit patterns Grant 4,654,583 - Ninomiya , et al. March 31, 1	1987-03-31
Inspection method and apparatus for joint junction states Grant 4,641,527 - Hiroi , et al. February 10, 1	1987-02-10
Robot vision system Grant 4,611,292 - Ninomiya , et al. September 9, 1	1986-09-09
Robot system for recognizing three dimensional shapes Grant 4,575,304 - Nakagawa , et al. March 11, 1	1986-03-11