loadpatents
name:-0.0017340183258057
name:-0.023683071136475
name:-0.00049495697021484
Ninomiya; Ken Patent Filings

Ninomiya; Ken

Patent Applications and Registrations

Patent applications and USPTO patent grants for Ninomiya; Ken.The latest application filed is for "scanning electron microscope and method for dimension measuring by using the same".

Company Profile
0.23.0
  • Ninomiya; Ken - Higashimatsuyama JP
  • Ninomiya; Ken - Higasgi-Matsuyama JP
  • Ninomiya; Ken - Higashi-Matsuyama JP
  • Ninomiya; Ken - Hachioji JP
  • Ninomiya; Ken - Tokyo JP
  • Ninomiya; Ken - Nakano JP
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Scanning electron microscope and method for dimension measuring by using the same
Grant 6,114,695 - Todokoro , et al. September 5, 2
2000-09-05
Scanning electron microscope and method for dimension measuring by using the same
Grant 5,969,357 - Todokoro , et al. October 19, 1
1999-10-19
Method and apparatus for X-ray analyses
Grant 5,877,498 - Sugimoto , et al. March 2, 1
1999-03-02
Scanning electron microscope and method for dimension measuring by using the same
Grant 5,866,904 - Todokoro , et al. February 2, 1
1999-02-02
Scanning electron microscope and method for dimension measuring by using the same
Grant 5,594,245 - Todokoro , et al. January 14, 1
1997-01-14
Method and apparatus for x-ray analyses
Grant 5,594,246 - Sudo , et al. January 14, 1
1997-01-14
Surface analysis method and apparatus for carrying out the same
Grant 5,481,109 - Ninomiya , et al. January 2, 1
1996-01-02
Surface analyzing method and apparatus
Grant 5,220,169 - Ninomiya , et al. June 15, 1
1993-06-15
Surface analysis method and apparatus
Grant 5,138,158 - Ninomiya , et al. August 11, 1
1992-08-11
Surface measuring method and apparatus
Grant 5,115,130 - Suzuki , et al. May 19, 1
1992-05-19
Method of surface treatment
Grant 5,108,543 - Suzuki , et al. April 28, 1
1992-04-28
Surface analysis method and apparatus
Grant 5,055,679 - Ninomiya , et al. October 8, 1
1991-10-08
Surface treatment apparatus
Grant 4,901,667 - Suzuki , et al. February 20, 1
1990-02-20
Method of and apparatus for etching
Grant 4,844,767 - Okudaira , et al. July 4, 1
1989-07-04
Method for microwave plasma processing
Grant 4,705,595 - Okudaira , et al. November 10, 1
1987-11-10
Ion source
Grant 4,658,143 - Tokiguchi , et al. April 14, 1
1987-04-14
Dry-processing apparatus
Grant 4,624,214 - Suzuki , et al. November 25, 1
1986-11-25
Method and apparatus for surface treatment by plasma
Grant 4,579,623 - Suzuki , et al. April 1, 1
1986-04-01
Microwave plasma etching apparatus
Grant 4,559,100 - Ninomiya , et al. December 17, 1
1985-12-17
Surface treatment apparatus
Grant 4,522,674 - Ninomiya , et al. June 11, 1
1985-06-11
Method for growing silicon-including film by employing plasma deposition
Grant 4,481,229 - Suzuki , et al. November 6, 1
1984-11-06
Microwave plasma etching
Grant 4,462,863 - Nishimatsu , et al. July 31, 1
1984-07-31
Microwave plasma source
Grant 4,433,228 - Nishimatsu , et al. February 21, 1
1984-02-21

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