Nimura; Kazutaka

Patent Applications and Registrations

Patent applications and USPTO patent grants for Nimura; Kazutaka.The latest application filed is for "charged particle beam device, electron microscope and sample observation method".

Company Profile

0.7.7

Nimura; Kazutaka - Tokyo JP
Nimura; Kazutaka - Nagoya JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Anti-contamination trap, and vacuum application device Grant 10,269,533 - Mizuo , et al.	2019-04-23
Charged particle beam device, electron microscope and sample observation method Grant 10,204,761 - Sunaoshi , et al. Feb	2019-02-12
Charged Particle Beam Device, Electron Microscope and Sample Observation Method App 20170221676 - SUNAOSHI; Takeshi ; et al.	2017-08-03
Anti-Contamination Trap, and Vacuum Application Device App 20160203940 - MIZUO; Takashi ; et al.	2016-07-14
Method of forming a sample image and charged particle beam apparatus Grant 7,800,059 - Sato , et al. September 21, 2	2010-09-21
Method of forming a sample image and charged particle beam apparatus App 20080217535 - Sato; Mitsugu ; et al.	2008-09-11
Method of forming a sample image and charged particle beam apparatus Grant 7,361,894 - Sato , et al. April 22, 2	2008-04-22
Method of forming a sample image and charged particle beam apparatus App 20070029478 - Sato; Mitsugu ; et al.	2007-02-08
Method of forming a sample image and charged particle beam apparatus Grant 7,164,126 - Sato , et al. January 16, 2	2007-01-16
Method of forming a sample image and charged particle beam apparatus Grant 7,034,296 - Sato , et al. April 25, 2	2006-04-25
Scanning electron microscope and sample observing method using it Grant 6,963,067 - Takeuchi , et al. November 8, 2	2005-11-08
Scanning electron microscope and sample observing method using it App 20040188611 - Takeuchi, Shuichi ; et al.	2004-09-30
Method of forming a sample image and charged particle beam apparatus App 20030141451 - Sato, Mitsugu ; et al.	2003-07-31
Method of forming a sample image and charged particle beam apparatus App 20030111602 - Sato, Mitsugu ; et al.	2003-06-19

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