NIKON-TRIMBLE CO., LTD.

Patent Applications and Registrations

Patent applications and USPTO patent grants for NIKON-TRIMBLE CO., LTD..The latest application filed is for "monitoring method, monitoring system, and program".

Company Profile

2.12.8

NIKON-TRIMBLE CO., LTD. - Tokyo N/A JP
NIKON-TRIMBLE CO., LTD - Tokyo N/A JP
Nikon-Trimble Co., Ltd. - JP JP
NIKON-TRIMBLE CO., LTD. - Ota-ku JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Monitoring method, monitoring system, and program Grant 11,428,527 - Ohhashi August 30, 2	2022-08-30
Surveying instrument and program Grant 11,236,997 - Tanaka , et al. February 1, 2	2022-02-01
Calculation system, calculation method, program, and target Grant 11,132,789 - Ohshima September 28, 2	2021-09-28
Monitoring Method, Monitoring System, And Program App 20200326187 - OHHASHI; Tetsuya	2020-10-15
Calculation System, Calculation Method, Program, And Target App 20200175666 - OHSHIMA; Yuichi	2020-06-04
Defect Detection Apparatus And Program App 20180293725 - OHSHIMA; Yuichi	2018-10-11
Surveying Instrument And Program App 20170307370 - TANAKA; Tomohiro ; et al.	2017-10-26
Surveying control device, surveying device, control method for surveying device, and control program therefor Grant 9,541,390 - Maruyama January 10, 2	2017-01-10
Surveying instrument Grant D761,674 - Nikaido July 19, 2	2016-07-19
Surveying Control Device, Surveying Device, Control Method For Surveying Device, And Control Program Therefor App 20150176991 - Maruyama; Tomohiro	2015-06-25
Electronic tacheometer Grant D629,314 - Ogasawara December 21, 2	2010-12-21
Surveying instrument, target for surveying and surveying system App 20040233415 - Nakamura, Masahiro ; et al.	2004-11-25
Focusing type distance measurement apparatus Grant 6,753,951 - Fukumoto June 22, 2	2004-06-22

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