Nikitine; Alexandre

Patent Applications and Registrations

Patent applications and USPTO patent grants for Nikitine; Alexandre.The latest application filed is for "fast 3d height measurement method and system".

Company Profile

0.6.7

Nikitine; Alexandre - Montreal CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method and system for measuring the relief of an object Grant RE42,899 - Coulombe , et al. November 8, 2	2011-11-08
System and method for height profile measurement of reflecting objects Grant 7,522,289 - Cantin , et al. April 21, 2	2009-04-21
System for simultaneous projections of multiple phase-shifted patterns for the three-dimensional inspection of an object Grant 7,403,650 - Coulombe , et al. July 22, 2	2008-07-22
Fast 3d Height Measurement Method And System App 20080068617 - Cantin; Michel ; et al.	2008-03-20
Shadow-free 3D and 2D measurement system and method Grant 7,340,107 - Berard , et al. March 4, 2	2008-03-04
System For Simultaneous Projections Of Multiple Phase-shifted Patterns For The Three-dimensional Inspection Of An Object App 20070146727 - Coulombe; Alain ; et al.	2007-06-28
System for simultaneous projections of multiple phase-shifted patterns for the three-dimensional inspection of an object Grant 7,079,666 - Coulombe , et al. July 18, 2	2006-07-18
System and method for height profile measurement of reflecting objects App 20060077398 - Cantin; Michel ; et al.	2006-04-13
Method and system for measuring the relief of an object Grant 7,023,559 - Coulombe , et al. April 4, 2	2006-04-04
Transparent object height measurement App 20060017936 - Cantin; Michel ; et al.	2006-01-26
Fast 3D height measurement method and system App 20040130730 - Cantin, Michel ; et al.	2004-07-08
Shadow-free 3D and 2D measurement system and method App 20040047517 - Berard, Louis ; et al.	2004-03-11
System for simultaneous projections of multiple phase-shifted patterns for the three-dimensional inspection of an object App 20020018118 - Coulombe, Alain ; et al.	2002-02-14

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