Patent | Date |
---|
Wafer Alignment Using Form Birefringence Of Targets Or Product App 20220137523 - ADAMS; Joshua ;   et al. | 2022-05-05 |
Alignment mark for two-dimensional alignment in an alignment system Grant 11,156,928 - Nijmeijer , et al. October 26, 2 | 2021-10-26 |
Apparatus with a sensor and a method of performing target measurement Grant 11,054,751 - Ye , et al. July 6, 2 | 2021-07-06 |
Alignment Mark For Two-Dimensional Alignment In An Alignment System App 20200124995 - NIJMEIJER; Gerrit Johannes ;   et al. | 2020-04-23 |
Substrate placement in immersion lithography Grant 10,345,711 - Hoogendam , et al. July 9, 2 | 2019-07-09 |
An Apparatus With A Sensor And A Method Of Performing Target Measurement App 20180299793 - YE; Hong ;   et al. | 2018-10-18 |
Substrate Placement In Immersion Lithography App 20180067401 - HOOGENDAM; Christiaan Alexander ;   et al. | 2018-03-08 |
Substrate placement in immersion lithography Grant 9,740,106 - Hoogendam , et al. August 22, 2 | 2017-08-22 |
Mark position measuring apparatus and method, lithographic apparatus and device manufacturing method Grant 9,551,939 - Mathijssen , et al. January 24, 2 | 2017-01-24 |
Position measuring apparatus, position measuring method, lithographic apparatus and device manufacturing method Grant 9,506,743 - Den Boef , et al. November 29, 2 | 2016-11-29 |
Substrate Placement In Immersion Lithography App 20160054665 - HOOGENDAM; Christiaan Alexander ;   et al. | 2016-02-25 |
Substrate placement in immersion lithography Grant 9,182,222 - Hoogendam , et al. November 10, 2 | 2015-11-10 |
Mark Position Measuring Apparatus And Method, Lithographic Apparatus And Device Manufacturing Method App 20150234290 - Mathijssen; Simon Gijsbert Josephus ;   et al. | 2015-08-20 |
Position Measuring Apparatus, Position Measuring Method, Lithographic Apparatus And Device Manufacturing Method App 20150219438 - Den Boef; Arie Jeffrey ;   et al. | 2015-08-06 |
Substrate Placement In Immersion Lithography App 20130182231 - Hoogendam; Christiaan Alexander ;   et al. | 2013-07-18 |
Substrate placement in immersion lithography Grant 8,441,617 - Hoogendam , et al. May 14, 2 | 2013-05-14 |
Substrate Placement In Immersion Lithography App 20120050740 - HOOGENDAM; CHRISTIAAN ALEXANDER ;   et al. | 2012-03-01 |
Substrate placement in immersion lithography Grant 8,077,291 - Hoogendam , et al. December 13, 2 | 2011-12-13 |
Lithographic apparatus, method of exposing a substrate, method of measurement, device manufacturing method, and device manufactured thereby Grant 7,835,017 - Modderman , et al. November 16, 2 | 2010-11-16 |
Substrate placement in immersion lithography App 20080106723 - Hoogendam; Christiaan Alexander ;   et al. | 2008-05-08 |
Substrate placement in immersion lithography Grant 7,352,440 - Hoogendam , et al. April 1, 2 | 2008-04-01 |
Lithographic Apparatus, Method of Exposing a Substrate, Method of Measurement, Device Manufacturing Method, and Device Manufacturing Thereby App 20070252963 - Modderman; Theodorus Marinus ;   et al. | 2007-11-01 |
System and method of measurement, system and method of alignment, lithographic apparatus and method Grant 7,280,228 - Nijmeijer , et al. October 9, 2 | 2007-10-09 |
Off-axis levelling in lithographic projection apparatus Grant 7,206,058 - Modderman , et al. April 17, 2 | 2007-04-17 |
Lithographic projection apparatus using catoptrics in an optical sensor system, optical arrangement, method of measuring, and device manufacturing method Grant 7,116,401 - Nijmeijer , et al. October 3, 2 | 2006-10-03 |
Off-axis levelling in lithographic projection apparatus App 20060176459 - Modderman; Theodorus Marinus ;   et al. | 2006-08-10 |
Substrate placement in immersion lithography App 20060126038 - Hoogendam; Christiaan Alexander ;   et al. | 2006-06-15 |
Lithographic apparatus, device manufacturing method, and device manufactured thereby Grant 6,987,555 - Teunissen , et al. January 17, 2 | 2006-01-17 |
Lithographic apparatus, method of calibration, calibration plate, device manufacturing method, and device manufactured thereby Grant 6,955,074 - Levasier , et al. October 18, 2 | 2005-10-18 |
Off-axis leveling in lithographic projection apparatus Grant 6,924,884 - Boonman , et al. August 2, 2 | 2005-08-02 |
Lithographic apparatus, method of calibration, calibration plate, device manufacturing method, and device manufactured thereby App 20050138988 - Levasier, Leon Martin ;   et al. | 2005-06-30 |
Lithographic apparatus, method of exposing a substrate, method of measurement, device manufacturing method, and device manufactured thereby App 20050134816 - Modderman, Theodorus Marinus ;   et al. | 2005-06-23 |
Off-axis levelling in lithographic projection apparatus Grant 6,882,405 - Jasper , et al. April 19, 2 | 2005-04-19 |
System and method of measurement, system and method of alignment, lithographic apparatus and method App 20050046845 - Nijmeijer, Gerrit Johannes ;   et al. | 2005-03-03 |
Lithographic apparatus, device manufacturing method, and device manufactured thereby App 20050030507 - Teunissen, Paulus Antonius Andreas ;   et al. | 2005-02-10 |
Lithographic projection apparatus using catoptrics in an optical sensor system, optical arrangement, method of measuring, and device manufacturing method App 20040189964 - Nijmeijer, Gerrit Johannes ;   et al. | 2004-09-30 |
Off-axis levelling in lithographic projection apparatus App 20040130691 - Boonman, Marcus Emile Joannes ;   et al. | 2004-07-08 |
Off-axis levelling in lithographic projection apparatus App 20040080737 - Jasper, Johannes Christiaan Maria ;   et al. | 2004-04-29 |