loadpatents
name:-0.026479005813599
name:-0.019325017929077
name:-0.0028829574584961
NIJMEIJER; Gerrit Johannes Patent Filings

NIJMEIJER; Gerrit Johannes

Patent Applications and Registrations

Patent applications and USPTO patent grants for NIJMEIJER; Gerrit Johannes.The latest application filed is for "wafer alignment using form birefringence of targets or product".

Company Profile
2.19.21
  • NIJMEIJER; Gerrit Johannes - Stamford CT
  • Nijmeijer; Gerrit Johannes - Larchmont NY
  • Nijmeijer; Gerrit Johannes - Starmford CT
  • Nijmeijer; Gerrit Johannes - Eindhoven NL
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Wafer Alignment Using Form Birefringence Of Targets Or Product
App 20220137523 - ADAMS; Joshua ;   et al.
2022-05-05
Alignment mark for two-dimensional alignment in an alignment system
Grant 11,156,928 - Nijmeijer , et al. October 26, 2
2021-10-26
Apparatus with a sensor and a method of performing target measurement
Grant 11,054,751 - Ye , et al. July 6, 2
2021-07-06
Alignment Mark For Two-Dimensional Alignment In An Alignment System
App 20200124995 - NIJMEIJER; Gerrit Johannes ;   et al.
2020-04-23
Substrate placement in immersion lithography
Grant 10,345,711 - Hoogendam , et al. July 9, 2
2019-07-09
An Apparatus With A Sensor And A Method Of Performing Target Measurement
App 20180299793 - YE; Hong ;   et al.
2018-10-18
Substrate Placement In Immersion Lithography
App 20180067401 - HOOGENDAM; Christiaan Alexander ;   et al.
2018-03-08
Substrate placement in immersion lithography
Grant 9,740,106 - Hoogendam , et al. August 22, 2
2017-08-22
Mark position measuring apparatus and method, lithographic apparatus and device manufacturing method
Grant 9,551,939 - Mathijssen , et al. January 24, 2
2017-01-24
Position measuring apparatus, position measuring method, lithographic apparatus and device manufacturing method
Grant 9,506,743 - Den Boef , et al. November 29, 2
2016-11-29
Substrate Placement In Immersion Lithography
App 20160054665 - HOOGENDAM; Christiaan Alexander ;   et al.
2016-02-25
Substrate placement in immersion lithography
Grant 9,182,222 - Hoogendam , et al. November 10, 2
2015-11-10
Mark Position Measuring Apparatus And Method, Lithographic Apparatus And Device Manufacturing Method
App 20150234290 - Mathijssen; Simon Gijsbert Josephus ;   et al.
2015-08-20
Position Measuring Apparatus, Position Measuring Method, Lithographic Apparatus And Device Manufacturing Method
App 20150219438 - Den Boef; Arie Jeffrey ;   et al.
2015-08-06
Substrate Placement In Immersion Lithography
App 20130182231 - Hoogendam; Christiaan Alexander ;   et al.
2013-07-18
Substrate placement in immersion lithography
Grant 8,441,617 - Hoogendam , et al. May 14, 2
2013-05-14
Substrate Placement In Immersion Lithography
App 20120050740 - HOOGENDAM; CHRISTIAAN ALEXANDER ;   et al.
2012-03-01
Substrate placement in immersion lithography
Grant 8,077,291 - Hoogendam , et al. December 13, 2
2011-12-13
Lithographic apparatus, method of exposing a substrate, method of measurement, device manufacturing method, and device manufactured thereby
Grant 7,835,017 - Modderman , et al. November 16, 2
2010-11-16
Substrate placement in immersion lithography
App 20080106723 - Hoogendam; Christiaan Alexander ;   et al.
2008-05-08
Substrate placement in immersion lithography
Grant 7,352,440 - Hoogendam , et al. April 1, 2
2008-04-01
Lithographic Apparatus, Method of Exposing a Substrate, Method of Measurement, Device Manufacturing Method, and Device Manufacturing Thereby
App 20070252963 - Modderman; Theodorus Marinus ;   et al.
2007-11-01
System and method of measurement, system and method of alignment, lithographic apparatus and method
Grant 7,280,228 - Nijmeijer , et al. October 9, 2
2007-10-09
Off-axis levelling in lithographic projection apparatus
Grant 7,206,058 - Modderman , et al. April 17, 2
2007-04-17
Lithographic projection apparatus using catoptrics in an optical sensor system, optical arrangement, method of measuring, and device manufacturing method
Grant 7,116,401 - Nijmeijer , et al. October 3, 2
2006-10-03
Off-axis levelling in lithographic projection apparatus
App 20060176459 - Modderman; Theodorus Marinus ;   et al.
2006-08-10
Substrate placement in immersion lithography
App 20060126038 - Hoogendam; Christiaan Alexander ;   et al.
2006-06-15
Lithographic apparatus, device manufacturing method, and device manufactured thereby
Grant 6,987,555 - Teunissen , et al. January 17, 2
2006-01-17
Lithographic apparatus, method of calibration, calibration plate, device manufacturing method, and device manufactured thereby
Grant 6,955,074 - Levasier , et al. October 18, 2
2005-10-18
Off-axis leveling in lithographic projection apparatus
Grant 6,924,884 - Boonman , et al. August 2, 2
2005-08-02
Lithographic apparatus, method of calibration, calibration plate, device manufacturing method, and device manufactured thereby
App 20050138988 - Levasier, Leon Martin ;   et al.
2005-06-30
Lithographic apparatus, method of exposing a substrate, method of measurement, device manufacturing method, and device manufactured thereby
App 20050134816 - Modderman, Theodorus Marinus ;   et al.
2005-06-23
Off-axis levelling in lithographic projection apparatus
Grant 6,882,405 - Jasper , et al. April 19, 2
2005-04-19
System and method of measurement, system and method of alignment, lithographic apparatus and method
App 20050046845 - Nijmeijer, Gerrit Johannes ;   et al.
2005-03-03
Lithographic apparatus, device manufacturing method, and device manufactured thereby
App 20050030507 - Teunissen, Paulus Antonius Andreas ;   et al.
2005-02-10
Lithographic projection apparatus using catoptrics in an optical sensor system, optical arrangement, method of measuring, and device manufacturing method
App 20040189964 - Nijmeijer, Gerrit Johannes ;   et al.
2004-09-30
Off-axis levelling in lithographic projection apparatus
App 20040130691 - Boonman, Marcus Emile Joannes ;   et al.
2004-07-08
Off-axis levelling in lithographic projection apparatus
App 20040080737 - Jasper, Johannes Christiaan Maria ;   et al.
2004-04-29

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