loadpatents
name:-0.012211084365845
name:-0.0096189975738525
name:-0.00043988227844238
Niijima; Hirokatsu Patent Filings

Niijima; Hirokatsu

Patent Applications and Registrations

Patent applications and USPTO patent grants for Niijima; Hirokatsu.The latest application filed is for "test apparatus, test method and manufacturing method".

Company Profile
0.8.10
  • Niijima; Hirokatsu - Tokyo JP
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Test apparatus, test method and manufacturing method
Grant 8,014,969 - Niijima , et al. September 6, 2
2011-09-06
Test Apparatus, Test Method And Manufacturing Method
App 20090240365 - NIIJIMA; HIROKATSU ;   et al.
2009-09-24
Test apparatus and test method
Grant 7,447,955 - Niijima , et al. November 4, 2
2008-11-04
Changing Point Detecting Circuit, Jitter Measuring Apparatus And Test Apparatus
App 20080228417 - BABA; TADAHIKO ;   et al.
2008-09-18
Test Apparatus, Test Method And Machine Readable Medium Storing A Program Therefor
App 20080229163 - NIIJIMA; HIROKATSU ;   et al.
2008-09-18
Test apparatus and test method
Grant 7,409,615 - Nishimine , et al. August 5, 2
2008-08-05
Measuring apparatus, measuring method, and test apparatus
Grant 7,262,627 - Yamane , et al. August 28, 2
2007-08-28
Test apparatus and test method
App 20070136625 - Niijima; Hirokatsu ;   et al.
2007-06-14
Measuring apparatus, measuring method, and test apparatus
App 20070096762 - Yamane; Tomoyuki ;   et al.
2007-05-03
Semiconductor test device and timing measurement method
Grant 7,197,682 - Niijima March 27, 2
2007-03-27
Test apparatus and test method
App 20070022346 - Nishimine; Hiroaki ;   et al.
2007-01-25
Test apparatus
Grant 7,100,099 - Niijima August 29, 2
2006-08-29
Test apparatus
App 20060129335 - Niijima; Hirokatsu
2006-06-15
Jitter measuring apparatus and a testing apparatus
Grant 7,002,334 - Tanaka , et al. February 21, 2
2006-02-21
Jitter measuring apparatus and a testing apparatus
App 20050218881 - Tanaka, Kouichi ;   et al.
2005-10-06
Semiconductor test device and timing measurement method
App 20050034044 - Niijima, Hirokatsu
2005-02-10
Jitter quantity calculator and tester
Grant 6,768,954 - Niijima July 27, 2
2004-07-27
Jitter quantity calculator and tester
App 20030210032 - Niijima, Hirokatsu
2003-11-13

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