Ni; Qiliang

Patent Applications and Registrations

Patent applications and USPTO patent grants for Ni; Qiliang.The latest application filed is for "method for detecting ultra-small defect on wafer surface".

Company Profile

0.6.9

Ni; Qiliang - Shanghai CN

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method for detecting ultra-small defect on wafer surface Grant 11,121,045 - Hu , et al. September 14, 2	2021-09-14
Method for Detecting Ultra-Small Defect on Wafer Surface App 20210057289 - Hu; Xianghua ; et al.	2021-02-25
Method of detecting and measuring contact alignment shift relative to gate structures in a semicondcutor device Grant 9,269,639 - Fan , et al. February 23, 2	2016-02-23
Method for monitoring alignment between contact holes and polycrystalline silicon gate Grant 9,080,863 - Ni , et al. July 14, 2	2015-07-14
Method of inspecting misalignment of polysilicon gate Grant 8,987,013 - Fan , et al. March 24, 2	2015-03-24
Method of Inspecting Misalignment of Polysilicon Gate App 20150004723 - FAN; Rongwei ; et al.	2015-01-01
Method Of Detecting And Measuring Contact Alignment Shift Relative To Gate Structures In A Semicondcutor Device App 20140377888 - Fan; Rongwei ; et al.	2014-12-25
Method of detecting the circular uniformity of the semiconductor circular contact holes Grant 8,865,482 - Wang , et al. October 21, 2	2014-10-21
Method Of Detecting The Circular Uniformity Of The Semiconductor Circular Contact Holes App 20140127835 - WANG; Kai ; et al.	2014-05-08
Measurement of lateral diffusion of implanted ions in doped well region of semiconductor devices Grant 8,658,438 - Fan , et al. February 25, 2	2014-02-25
Measurement Of Lateral Diffusion Of Implanted Ions In Doped Well Region Of Semiconductor Devices App 20140011304 - FAN; Rongwei ; et al.	2014-01-09
Method For Monitoring Alignment Between Contact Holes And Polycrystalline Silicon Gate App 20130342842 - Ni; Qiliang ; et al.	2013-12-26
Method For Monitoring Devices In Semiconductor Process App 20130137196 - CHEN; Hunglin ; et al.	2013-05-30
Semiconductor Yield Management System App 20130138239 - CHEN; Hunglin ; et al.	2013-05-30
Method for Preventing Wafer Edge Peeling in Metal Wiring Process App 20080124891 - Zhang; Kegang ; et al.	2008-05-29

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