Ni; Cheng-Tsung

Patent Applications and Registrations

Patent applications and USPTO patent grants for Ni; Cheng-Tsung.The latest application filed is for "power metal oxide semiconductor field effect transistor layout".

Company Profile

0.6.4

Ni; Cheng-Tsung - Hsinchu TW

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Power metal oxide semiconductor field effect transistor layout Grant 6,888,197 - Ni , et al. May 3, 2	2005-05-03
Method for forming dual oxide layers at bottom of trench Grant 6,821,913 - Chuang , et al. November 23, 2	2004-11-23
Method of simultaneously implementing differential gate oxide thickness using fluorine bearing impurities Grant 6,784,115 - Ni , et al. August 31, 2	2004-08-31
Power metal oxide semiconductor field effect transistor layout App 20040113205 - Ni, Cheng-Tsung ; et al.	2004-06-17
Fabricating a DMOS transistor Grant 6,660,592 - Chuang , et al. December 9, 2	2003-12-09
MOS transistors having dual gates and self-aligned interconnect contact windows Grant 6,657,263 - Ni December 2, 2	2003-12-02
Fabricating a DMOS transistor App 20030096485 - Chuang, Chiao-Shun ; et al.	2003-05-22
Method for forming dual oxide layers at bottom of trench App 20030068901 - Chuang, Chiao-Shun ; et al.	2003-04-10
MOS transistors having dual gates and self-aligned interconnect contact windows App 20010049165 - Ni, Cheng-Tsung	2001-12-06
Method for fabricating MOSFET having increased effective gate length Grant 6,127,699 - Ni , et al. October 3, 2	2000-10-03

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.