| Patent | Date |
|---|
Memory device and systems and methods for selecting memory cells in the memory device
Grant 9,595,335 - Wu , et al. March 14, 2 | 2017-03-14 |
Selecting Memory Cells
App 20160005477 - Wu; Tsung-Ching ; et al. | 2016-01-07 |
Selecting memory cells using source lines
Grant 9,142,306 - Wu , et al. September 22, 2 | 2015-09-22 |
Communication protocol method and apparatus for a single wire device
Grant 8,861,666 - Ng October 14, 2 | 2014-10-14 |
Method of computing a width of a scribe region based on a bonding structure that extends into the scribe reigon in a wafer-level chip scale (WLCSP) packaging
Grant 8,828,846 - Ng September 9, 2 | 2014-09-09 |
Selecting Memory Cells
App 20140198571 - Wu; Tsung-Ching ; et al. | 2014-07-17 |
WLCSP for Small, High Volume Die
App 20130026605 - Ng; Philip S. | 2013-01-31 |
Communication Protocol Method And Apparatus For A Single Wire Device
App 20120099662 - Ng; Philip S. | 2012-04-26 |
Communication protocol method and apparatus for a single wire device
Grant 8,107,577 - Ng January 31, 2 | 2012-01-31 |
Snap-back tolerant integrated circuits
Grant 8,085,604 - Ng December 27, 2 | 2011-12-27 |
Capacitive node isolation for electrostatic discharge circuit
Grant 7,982,499 - Ng July 19, 2 | 2011-07-19 |
Communication Protocol Method And Apparatus For A Single Wire Device
App 20110110461 - Ng; Philip S. | 2011-05-12 |
Communication protocol method and apparatus for a single wire device
Grant 7,881,415 - Ng February 1, 2 | 2011-02-01 |
Serial communications bus with active pullup
Grant 7,868,660 - Ng , et al. January 11, 2 | 2011-01-11 |
Circuit to control voltage ramp rate
Grant 7,848,151 - Chan , et al. December 7, 2 | 2010-12-07 |
Device and method of supplying power to targets on single-wire interface
Grant 7,782,240 - Ng , et al. August 24, 2 | 2010-08-24 |
Indirect measurement of negative margin voltages in endurance testing of EEPROM cells
Grant 7,751,248 - Ng , et al. July 6, 2 | 2010-07-06 |
Snap-back Tolerant Integrated Circuits
App 20100149710 - Ng; Philip S. | 2010-06-17 |
Circuit reset testing methods
Grant 7,710,105 - Chan , et al. May 4, 2 | 2010-05-04 |
Communications Device Without Passive Pullup Components
App 20100064083 - Ng; Philip S. ; et al. | 2010-03-11 |
Circuit To Control Voltage Ramp Rate
App 20090168586 - Chan; Johnny ; et al. | 2009-07-02 |
Circuit to control voltage ramp rate
Grant 7,512,008 - Chan , et al. March 31, 2 | 2009-03-31 |
Device And Method Of Supplying Power To Targets On Single-wire Interface
App 20080298385 - Ng; Philip S. ; et al. | 2008-12-04 |
Communication Protocol Method And Apparatus For A Single Wire Device
App 20080159432 - Ng; Philip S. | 2008-07-03 |
Indirect Measurement Of Negative Margin Voltages In Endurance Testing Of Eeprom Cells
App 20080144386 - Ng; Philip S. ; et al. | 2008-06-19 |
Indirect measurement of negative margin voltages in endurance testing of EEPROM cells
Grant 7,336,540 - Ng , et al. February 26, 2 | 2008-02-26 |
Capacitive Node Isolation For Electrostatic Discharge Circuit
App 20080024169 - Ng; Philip S. | 2008-01-31 |
Method and apparatus for implementing walkout of device junctions
Grant 7,307,898 - Ng , et al. December 11, 2 | 2007-12-11 |
Serial Communications Bus With Active Pullup
App 20070247184 - Ng; Philip S. ; et al. | 2007-10-25 |
High Speed Dual-wire Communications Device Requiring No Passive Pullup Components
App 20070250652 - Ng; Philip S. ; et al. | 2007-10-25 |
Indirect measurement of negative margin voltages in endurance testing of EEPROM cells
App 20070237013 - Ng; Philip S. ; et al. | 2007-10-11 |
Method of testing power-on reset circuit and receiving circuit resetting capability
App 20070216397 - Chan; Johnny ; et al. | 2007-09-20 |
Memory data access scheme
Grant 7,257,046 - Son , et al. August 14, 2 | 2007-08-14 |
Method and system for enhancing the endurance of memory cells
Grant 7,257,668 - Chan , et al. August 14, 2 | 2007-08-14 |
Method and apparatus for implementing walkout of device junctions
App 20070121384 - Ng; Philip S. ; et al. | 2007-05-31 |
Circuit to control voltage ramp rate
App 20070121382 - Chan; Johnny ; et al. | 2007-05-31 |
Method of sensing an EEPROM reference cell
Grant 7,180,795 - Chan , et al. February 20, 2 | 2007-02-20 |
Fault tolerant data storage circuit
Grant 7,181,650 - Ng February 20, 2 | 2007-02-20 |
Method Of Sensing An Eeprom Reference Cell
App 20070030729 - Chan; Johnny ; et al. | 2007-02-08 |
Memory data access scheme
App 20060280020 - Son; Jinshu ; et al. | 2006-12-14 |
Method and system for enhancing the endurance of memory cells
App 20060236044 - Chan; Johnny ; et al. | 2006-10-19 |
Fuse data storage system using core memory
Grant 7,102,950 - Son , et al. September 5, 2 | 2006-09-05 |
Y-mux splitting scheme
Grant 7,099,202 - Son , et al. August 29, 2 | 2006-08-29 |
Method and system for enhancing the endurance of memory cells
Grant 7,082,490 - Chan , et al. July 25, 2 | 2006-07-25 |
Circuit for auto-clamping input pins to a definite voltage during power-up or reset
Grant 6,998,884 - Ng , et al. February 14, 2 | 2006-02-14 |
Fuse data storage system using core memory
App 20060023549 - Son; Jinshu ; et al. | 2006-02-02 |
Circuit for auto-clamping input pins to a definite voltage during power-up or reset
App 20050140419 - Ng, Philip S. ; et al. | 2005-06-30 |
Shift register with reduced area and power consumption
Grant 6,891,917 - Chan , et al. May 10, 2 | 2005-05-10 |
Method and system for enhancing the endurance of memory cells
App 20050086440 - Chan, Johnny ; et al. | 2005-04-21 |
Shift register with reduced area and power consumption
App 20050031068 - Chan, Johnny ; et al. | 2005-02-10 |
Fault tolerant data storage circuit
App 20040255196 - Ng, Philip S. | 2004-12-16 |
Circuit for testing and fine tuning integrated circuit (switch control circuit)
Grant 6,815,992 - Ng , et al. November 9, 2 | 2004-11-09 |
Method and apparatus for a serial access memory
Grant 6,038,185 - Ng , et al. March 14, 2 | 2000-03-14 |
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