Neumann; Jens Timo

Patent Applications and Registrations

Patent applications and USPTO patent grants for Neumann; Jens Timo.The latest application filed is for "cross section imaging with improved 3d volume image reconstruction accuracy".

Company Profile

4.5.10

Neumann; Jens Timo - Aalen DE

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method and devices for determining metrology sites Grant 11,436,506 - Srikantha , et al. September 6, 2	2022-09-06
Cross Section Imaging With Improved 3d Volume Image Reconstruction Accuracy App 20220138973 - Korb; Thomas ; et al.	2022-05-05
Interactive And Iterative Training Of A Classification Algorithm For Classifying Anomalies In Imaging Datasets App 20220044949 - Korb; Thomas ; et al.	2022-02-10
Processing Image Data Sets App 20210358101 - Neumann; Jens Timo ; et al.	2021-11-18
Method Of Recording An Image Using A Particle Microscope App 20210296089 - Zeidler; Dirk ; et al.	2021-09-23
Root Cause Analysis For Fabrication Processes Of Semiconductor Structures App 20210097673 - Neumann; Jens Timo ; et al.	2021-04-01
Multi-scanning electron microscopy for wafer alignment Grant 10,901,391 - Saraswatula , et al. January 26, 2	2021-01-26
Method And Devices For Determining Metrology Sites App 20200285976 - Srikantha; Abhilash ; et al.	2020-09-10
Error Reduction In Images Which Were Generated With Charged Particles And With The Aid Of Machine-learning-based Methods App 20200258212 - A1	2020-08-13
Imaging optical unit for a metrology system for examining a lithography mask Grant 10,606,048 - Ruoff , et al.	2020-03-31
Optical system of a microlithographic projection exposure apparatus and method of reducing image placement errors Grant 9,785,052 - Ruoff , et al. October 10, 2	2017-10-10
Measuring an optical symmetry property on a projection exposure apparatus Grant 9,703,205 - Neumann , et al. July 11, 2	2017-07-11
Imaging Optical Unit For A Metrology System For Examining A Lithography Mask App 20170131528 - Ruoff; Johannes ; et al.	2017-05-11
Measuring An Optical Symmetry Property On A Projection Exposure Apparatus App 20160004168 - NEUMANN; Jens Timo ; et al.	2016-01-07
Optical System of a Microlithographic Projection Exposure Apparatus and Method of Reducing Image Placement Errors App 20130188160 - Ruoff; Johannes ; et al.	2013-07-25

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.