Nemoto; Yuichi

Patent Applications and Registrations

Patent applications and USPTO patent grants for Nemoto; Yuichi.The latest application filed is for "construction management system and construction management method".

Company Profile

0.4.7

Nemoto; Yuichi - Tokyo JP
NEMOTO; Yuichi - Niigata-shi JP
Nemoto; Yuichi - Niigata N/A JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Construction Management System And Construction Management Method App 20180218301 - Shike; Chikashi ; et al.	2018-08-02
Construction Management System And Construction Management Method App 20180137446 - Shike; Chikashi ; et al.	2018-05-17
Method For Evaluating Atomic Vacancy In Surface Layer Of Silicon Wafer And Apparatus For Evaluating The Same App 20160258908 - GOTO; Terutaka ; et al.	2016-09-08
Method for quantitatively evaluating concentration of atomic vacancies existing in silicon wafer, method for manufacturing silicon wafer, and silicon wafer manufactured by the method for manufacturing silicon wafer Grant 8,578,777 - Goto , et al. November 12, 2	2013-11-12
Quantitative evaluation device of atomic vacancies existing in silicon wafer, method for the device, silicon wafer manufacturing method, and thin-film oscillator Grant 8,215,175 - Goto , et al. July 10, 2	2012-07-10
Method For Quantitatively Evaluating Concentration Of Atomic Vacancies Existing In Silicon Wafer, Method For Manufacturing Silicon Wafer, And Silicon Wafer Manufactured By The Method For Manufacturing Silicon Wafer App 20120168912 - Goto; Terutaka ; et al.	2012-07-05
Quantitative evaluation device and method of atomic vacancy existing in silicon wafer Grant 8,037,761 - Goto , et al. October 18, 2	2011-10-18
Quantitative Evaluation Device Of Atomic Vacancies Existing In Silicon Wafer, Method For The Device, Silicon Wafer Manufacturing Method, And Thin-film Oscillator App 20100186512 - Goto; Terutaka ; et al.	2010-07-29
METHOD FOR PRODUCING Si SINGLE CRYSTAL INGOT BY CZ METHOD App 20090217866 - Goto; Terutaka ; et al.	2009-09-03
Quantitative Evaluation Device And Method Of Atomic Vacancy Existing In Silicon Wafer App 20090064786 - Goto; Terutaka ; et al.	2009-03-12

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.