loadpatents
name:-0.014633178710938
name:-0.0084750652313232
name:-0.014456033706665
Neistein; Eyal Patent Filings

Neistein; Eyal

Patent Applications and Registrations

Patent applications and USPTO patent grants for Neistein; Eyal.The latest application filed is for "methods for accurate base calling using molecular barcodes".

Company Profile
13.6.12
  • Neistein; Eyal - Herzliya IL
  • Neistein; Eyal - Herzlyia IL
  • Neistein; Eyal - RaAnana IL
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Detecting defects in a semiconductor specimen
Grant 11,386,539 - Cohen , et al. July 12, 2
2022-07-12
Methods For Accurate Base Calling Using Molecular Barcodes
App 20220162590 - ALMOGY; Gilad ;   et al.
2022-05-26
Detecting targeted locations in a semiconductor specimen
Grant 11,107,207 - Cohen , et al. August 31, 2
2021-08-31
Detecting Targeted Locations In A Semiconductor Specimen
App 20210042905 - COHEN; Elad ;   et al.
2021-02-11
Computerized system and method for obtaining information about a region of an object
Grant 10,902,582 - Feldman , et al. January 26, 2
2021-01-26
Multi-perspective Wafer Analysis
App 20200400589 - FELDMAN; Haim ;   et al.
2020-12-24
Detecting Defects In A Semiconductor Specimen
App 20200380662 - COHEN; Elad ;   et al.
2020-12-03
Multi-perspective Wafer Analysis
App 20200232934 - FELDMAN; Haim ;   et al.
2020-07-23
Computerized System And Method For Obtaining Information About A Region Of An Object
App 20200234418 - FELDMAN; Haim ;   et al.
2020-07-23
Method of defect detection and system thereof
Grant 10,460,434 - Martin , et al. Oc
2019-10-29
Method of generating an examination recipe and system thereof
Grant 10,290,087 - Shkalim , et al.
2019-05-14
Method of detecting repeating defects and system thereof
Grant 10,275,872 - Pomeranz , et al.
2019-04-30
Method Of Generating An Examination Recipe And System Thereof
App 20190080447 - SHKALIM; Ariel ;   et al.
2019-03-14
Method Of Detecting Repeating Defects And System Thereof
App 20190066292 - Pomeranz; Karen ;   et al.
2019-02-28
Method Of Defect Detection And System Thereof
App 20190066291 - MARTIN; Limor ;   et al.
2019-02-28
Diffractive Optical Relay Device With Improved Color Uniformity
App 20100177388 - Cohen; Yoram ;   et al.
2010-07-15
Diffraction Grating With a Spatially Varying Duty-Cycle
App 20090128911 - Itzkovitch; Moti ;   et al.
2009-05-21

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