loadpatents
Patent applications and USPTO patent grants for Neistein; Eyal.The latest application filed is for "methods for accurate base calling using molecular barcodes".
Patent | Date |
---|---|
Detecting defects in a semiconductor specimen Grant 11,386,539 - Cohen , et al. July 12, 2 | 2022-07-12 |
Methods For Accurate Base Calling Using Molecular Barcodes App 20220162590 - ALMOGY; Gilad ;   et al. | 2022-05-26 |
Detecting targeted locations in a semiconductor specimen Grant 11,107,207 - Cohen , et al. August 31, 2 | 2021-08-31 |
Detecting Targeted Locations In A Semiconductor Specimen App 20210042905 - COHEN; Elad ;   et al. | 2021-02-11 |
Computerized system and method for obtaining information about a region of an object Grant 10,902,582 - Feldman , et al. January 26, 2 | 2021-01-26 |
Multi-perspective Wafer Analysis App 20200400589 - FELDMAN; Haim ;   et al. | 2020-12-24 |
Detecting Defects In A Semiconductor Specimen App 20200380662 - COHEN; Elad ;   et al. | 2020-12-03 |
Multi-perspective Wafer Analysis App 20200232934 - FELDMAN; Haim ;   et al. | 2020-07-23 |
Computerized System And Method For Obtaining Information About A Region Of An Object App 20200234418 - FELDMAN; Haim ;   et al. | 2020-07-23 |
Method of defect detection and system thereof Grant 10,460,434 - Martin , et al. Oc | 2019-10-29 |
Method of generating an examination recipe and system thereof Grant 10,290,087 - Shkalim , et al. | 2019-05-14 |
Method of detecting repeating defects and system thereof Grant 10,275,872 - Pomeranz , et al. | 2019-04-30 |
Method Of Generating An Examination Recipe And System Thereof App 20190080447 - SHKALIM; Ariel ;   et al. | 2019-03-14 |
Method Of Detecting Repeating Defects And System Thereof App 20190066292 - Pomeranz; Karen ;   et al. | 2019-02-28 |
Method Of Defect Detection And System Thereof App 20190066291 - MARTIN; Limor ;   et al. | 2019-02-28 |
Diffractive Optical Relay Device With Improved Color Uniformity App 20100177388 - Cohen; Yoram ;   et al. | 2010-07-15 |
Diffraction Grating With a Spatially Varying Duty-Cycle App 20090128911 - Itzkovitch; Moti ;   et al. | 2009-05-21 |
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