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name:-0.004767894744873
name:-0.0019469261169434
Neil; Mark A. Patent Filings

Neil; Mark A.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Neil; Mark A..The latest application filed is for "multilayer film metrology using an effective media approximation".

Company Profile
2.4.3
  • Neil; Mark A. - San Jose CA
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Multilayer film metrology using an effective media approximation
Grant 10,429,296 - Neil , et al. October 1, 2
2019-10-01
Multilayer Film Metrology Using An Effective Media Approximation
App 20190033211 - Neil; Mark A. ;   et al.
2019-01-31
Spectroscopy with tailored spectral sampling
Grant 10,151,631 - Neil , et al. Dec
2018-12-11
Spectroscopy with Tailored Spectral Sampling
App 20180094978 - Neil; Mark A. ;   et al.
2018-04-05
Apparatus And Methods For Real-time Three-dimensional Sem Imaging And Viewing Of Semiconductor Wafers
App 20120223227 - CHEN; Chien-Huei ;   et al.
2012-09-06
Region-of-interest based electron beam metrology
Grant 7,241,991 - Standiford , et al. July 10, 2
2007-07-10
Automated focusing of electron image
Grant 7,041,976 - Neil , et al. May 9, 2
2006-05-09

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