| Patent | Date |
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Apparatus For Acquiring 3-dimensional Maps Of A Scene
App 20220236411 - Nehmadi; Youval ; et al. | 2022-07-28 |
Apparatus For Acquiring 3-dimensional Maps Of A Scene
App 20220137214 - Nehmadi; Youval ; et al. | 2022-05-05 |
Managing a change in a physical property of a vehicle due to an external object
Grant 11,292,483 - Nehmadi , et al. April 5, 2 | 2022-04-05 |
Apparatus for acquiring 3-dimensional maps of a scene
Grant 11,226,413 - Nehmadi , et al. January 18, 2 | 2022-01-18 |
Apparatus For Acquiring 3-dimensional Maps Of A Scene
App 20210293963 - Nehmadi; Youval ; et al. | 2021-09-23 |
Computer Aided Driving
App 20210129868 - Nehmadi; Youval | 2021-05-06 |
Apparatus For Acquiring 3-dimensional Maps Of A Scene
App 20210080575 - Nehmadi; Youval ; et al. | 2021-03-18 |
Managing A Change In A Physical Property Of A Vehicle Due To An External Object
App 20200062273 - Nehmadi; Youval ; et al. | 2020-02-27 |
Method and system for generating multidimensional maps of a scene using a plurality of sensors of various types
Grant 10,445,928 - Nehmadi , et al. Oc | 2019-10-15 |
System and method for optimizing active measurements in 3-dimensional map generation
Grant 10,444,357 - Nehmadi , et al. Oc | 2019-10-15 |
Method And System For Generating Multidimensional Maps Of A Scene Using A Plurality Of Sensors Of Various Types
App 20180232947 - NEHMADI; Youval ; et al. | 2018-08-16 |
Generating 3-dimensional maps of a scene using passive and active measurements
Grant 10,024,965 - Nehmadi , et al. July 17, 2 | 2018-07-17 |
Alignment Markers To Facilitate Detection Of Object Orientation And Deformation
App 20170124367 - Margalit; Mordehai ; et al. | 2017-05-04 |
Three-dimensional Imaging Sensor Calibration
App 20160360185 - Margalit; Mordehai ; et al. | 2016-12-08 |
Apparatus For Acquiring 3-dimensional Maps Of A Scene
App 20160291154 - NEHMADI; Youval ; et al. | 2016-10-06 |
System And Method For Optimizing Active Measurements In 3-dimensional Map Generation
App 20160291155 - NEHMADI; Youval ; et al. | 2016-10-06 |
Generating 3-dimensional Maps Of A Scene Using Passive And Active Measurements
App 20160292905 - NEHMADI; Youval ; et al. | 2016-10-06 |
Method for translating the location, orientation and movement of a predefined object into computer generated data
Grant 9,424,690 - Nehmadi , et al. August 23, 2 | 2016-08-23 |
System And Method For Controlling Unmanned Vehicles
App 20160116912 - Nehmadi; Youval ; et al. | 2016-04-28 |
System and method for providing 3D imaging
Grant 9,303,989 - Nehmadi , et al. April 5, 2 | 2016-04-05 |
Method and apparatus for determining factors for design consideration in yield analysis
Grant 08924904 - | 2014-12-30 |
Method and apparatus for determining factors for design consideration in yield analysis
Grant 8,924,904 - Svidenko , et al. December 30, 2 | 2014-12-30 |
Inline defect analysis for sampling and SPC
Grant 8,799,831 - Nehmadi , et al. August 5, 2 | 2014-08-05 |
Method For Translating The Location, Orientation And Movement Of A Predefined Object Into Computer Generated Data
App 20140160117 - Nehmadi; Youval ; et al. | 2014-06-12 |
System And Method For Providing 3d Imaging
App 20120314037 - Nehmadi; Youval ; et al. | 2012-12-13 |
Stage yield prediction
Grant 7,962,864 - Nehmadi , et al. June 14, 2 | 2011-06-14 |
Dynamic inline yield analysis and prediction of a defect limited yield using inline inspection defects
Grant 7,937,179 - Shimshi , et al. May 3, 2 | 2011-05-03 |
System, method and computer software product for inspecting charged particle responsive resist
Grant 7,856,138 - Nehmadi , et al. December 21, 2 | 2010-12-21 |
Design-based method for grouping systematic defects in lithography pattern writing system
Grant 7,760,347 - Nehmadi , et al. July 20, 2 | 2010-07-20 |
Grouping systematic defects with feedback from electrical inspection
Grant 7,760,929 - Orbon , et al. July 20, 2 | 2010-07-20 |
Process monitoring system and method for processing a large number of sub-micron measurement targets
Grant 7,587,700 - Nehmadi , et al. September 8, 2 | 2009-09-08 |
Design-based Monitoring
App 20090007030 - Nehmadi; Youval ; et al. | 2009-01-01 |
Stage yield prediction
App 20080295047 - Nehmadi; Youval ; et al. | 2008-11-27 |
Inline defect analysis for sampling and SPC
App 20080295048 - Nehmadi; Youval ; et al. | 2008-11-27 |
Dynamic inline yield analysis and prediction
App 20080294281 - Shimshi; Rinat ; et al. | 2008-11-27 |
Method and apparatus for determining factors for design consideration in yield analysis
App 20080295063 - Svidenko; Vicky ; et al. | 2008-11-27 |
Process monitoring system and method
App 20080092088 - Nehmadi; Youval ; et al. | 2008-04-17 |
Grouping Systematic Defects With Feedback From Electrical Inspection
App 20070052963 - ORBON; JACOB J. ; et al. | 2007-03-08 |
System, method and computer software product for inspecting charged particle responsive resist
App 20060266833 - Nehmadi; Youval ; et al. | 2006-11-30 |
Design-based Method For Grouping Systematic Defects In Lithography Pattern Writing System
App 20060269120 - NEHMADI; YOUVAL ; et al. | 2006-11-30 |
Design-based monitoring
Grant 7,135,344 - Nehmadi , et al. November 14, 2 | 2006-11-14 |
Design-based monitoring
App 20050010890 - Nehmadi, Youval ; et al. | 2005-01-13 |
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