Negri; Daria
Patent Applications and Registrations
Patent applications and USPTO patent grants for Negri; Daria.The latest application filed is for "systems and methods for measurement of misregistration and amelioration thereof".
- Negri; Daria - Nesher IL
- NEGRI; Daria - Haifa IL
| Patent | Date |
|---|---|
| Systems and Methods for Measurement of Misregistration and Amelioration Thereof App 20220307824 - Volkovich; Roie ; et al. | 2022-09-29 |
| Method Of Measuring Misregistration In The Manufacture Of Topographic Semiconductor Device Wafers App 20220171296 - Negri; Daria ; et al. | 2022-06-02 |
| Method of measuring misregistration in the manufacture of topographic semiconductor device wafers Grant 11,281,112 - Negri , et al. March 22, 2 | 2022-03-22 |
| Wavelet System and Method for Ameliorating Misregistration and Asymmetry of Semiconductor Devices App 20220020649 - Saltoun; Lilach ; et al. | 2022-01-20 |
| System And Method For Generating Light App 20210325019 - ROTSCHILD; Carmel ; et al. | 2021-10-21 |
| Method Of Measuring Misregistration In The Manufacture Of Topographic Semiconductor Device Wafers App 20210200104 - Negri; Daria ; et al. | 2021-07-01 |
| System And Method For Measuring Misregistration Of Semiconductor Device Wafers Utilizing Induced Topography App 20210191279 - Negri; Daria ; et al. | 2021-06-24 |
| Nano-structured non-polarizing beamsplitter Grant 10,976,562 - Gorelik , et al. April 13, 2 | 2021-04-13 |
| Process compatibility improvement by fill factor modulation Grant 10,579,768 - Levinski , et al. | 2020-03-03 |
| Systems and methods for metrology with layer-specific illumination spectra Grant 10,444,161 - Manassen , et al. Oc | 2019-10-15 |
| Nano-Structured Non-Polarizing Beamsplitter App 20190107727 - Gorelik; Dmitry ; et al. | 2019-04-11 |
| Metrology imaging targets having reflection-symmetric pairs of reflection-asymmetric structures Grant 10,190,979 - Manassen , et al. Ja | 2019-01-29 |
| Systems and Methods for Metrology with Layer-Specific Illumination Spectra App 20180292326 - Manassen; Amnon ; et al. | 2018-10-11 |
| Process Compatibility Improvement by Fill Factor Modulation App 20180157784 - Levinski; Vladimir ; et al. | 2018-06-07 |
| Spectral control system Grant 9,921,050 - Manassen , et al. March 20, 2 | 2018-03-20 |
| Phase characterization of targets Grant 9,581,430 - Manassen , et al. February 28, 2 | 2017-02-28 |
| Spectral Control System App 20160305766 - Manassen; Amnon ; et al. | 2016-10-20 |
| Spectral control system Grant 9,341,769 - Manassen , et al. May 17, 2 | 2016-05-17 |
| Metrology Imaging Targets Having Reflection-symmetric Pairs Of Reflection-asymmetric Structures App 20160084758 - Manassen; Amnon ; et al. | 2016-03-24 |
| Optics symmetrization for metrology Grant 9,164,397 - Manassen , et al. October 20, 2 | 2015-10-20 |
| Metrology systems and methods Grant 9,080,971 - Kandel , et al. July 14, 2 | 2015-07-14 |
| Metrology Systems and Methods App 20150036142 - Kandel; Daniel ; et al. | 2015-02-05 |
| Metrology systems and methods Grant 8,873,054 - Kandel , et al. October 28, 2 | 2014-10-28 |
| Spectral Control System App 20140168650 - Manassen; Amnon ; et al. | 2014-06-19 |
| Phase Characterization Of Targets App 20140111791 - Manassen; Amnon ; et al. | 2014-04-24 |
| Overlay metrology by pupil phase analysis Grant 8,582,114 - Manassen , et al. November 12, 2 | 2013-11-12 |
| Metrology Systems and Methods App 20130229661 - Kandel; Daniel ; et al. | 2013-09-05 |
| Metrology systems and methods Grant 8,441,639 - Kandel , et al. May 14, 2 | 2013-05-14 |
| Overlay Metrology By Pupil Phase Analysis App 20130044331 - Manassen; Amnon ; et al. | 2013-02-21 |
| Optics Symmetrization For Metrology App 20120033226 - Manassen; Amnon ; et al. | 2012-02-09 |
| Metrology Systems And Methods App 20110069312 - Kandel; Daniel ; et al. | 2011-03-24 |
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