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name:-0.0088539123535156
name:-0.0066201686859131
name:-0.0019969940185547
Negi; Hideyuki Patent Filings

Negi; Hideyuki

Patent Applications and Registrations

Patent applications and USPTO patent grants for Negi; Hideyuki.The latest application filed is for "semiconductor integrated circuit and method of processing in semiconductor integrated circuit".

Company Profile
0.6.7
  • Negi; Hideyuki - Hamamatsu JP
  • Negi; Hideyuki - Kawasaki N/A JP
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Semiconductor integrated circuit and method of processing in semiconductor integrated circuit
Grant 9,542,266 - Deguchi , et al. January 10, 2
2017-01-10
Semiconductor Integrated Circuit And Method Of Processing In Semiconductor Integrated Circuit
App 20140372837 - Deguchi; Chikahiro ;   et al.
2014-12-18
Data receiving circuit, information processing apparatus, a computer readable storage medium, and data receiving method
Grant 8,855,242 - Watanabe , et al. October 7, 2
2014-10-07
Relay Device And Relay Method
App 20140294015 - SEKINO; Yutaka ;   et al.
2014-10-02
Data transmission system, data transmission method, and transmission device
Grant 8,744,030 - Sekino , et al. June 3, 2
2014-06-03
System For Packet Communication And Communication Method
App 20140040684 - Tomozaki; Toshihiro ;   et al.
2014-02-06
Data Receiving Circuit, Information Processing Apparatus, A Computer Readable Storage Medium, And Data Receiving Method
App 20130272454 - WATANABE; Hiroaki ;   et al.
2013-10-17
Memory test method and memory test device
Grant 8,503,259 - Shibazaki , et al. August 6, 2
2013-08-06
Data Transmission System, Data Transmission Method, And Transmission Device
App 20130114746 - SEKINO; Yutaka ;   et al.
2013-05-09
Test apparatus, test method, and integrated circuit
Grant 8,143,901 - Deguchi , et al. March 27, 2
2012-03-27
Memory test method and memory test device
App 20090296505 - Shibazaki; Shogo ;   et al.
2009-12-03
Test apparatus, test method, and integrated circuit
App 20090300443 - Deguchi; Chikahiro ;   et al.
2009-12-03

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