Neff; Benjamin R.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Neff; Benjamin R..The latest application filed is for "method and system for measuring optical properties of a medium using digital communication processing techniques".

Company Profile

0.6.5

Neff; Benjamin R. - West Lafayette IN
Neff; Benjamin R. - Fort Wayne IN

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method and system for measuring optical properties of a medium using digital communication processing techniques Grant 7,995,917 - Mendenhall , et al. August 9, 2	2011-08-09
Method And System For Measuring Optical Properties Of A Medium Using Digital Communication Processing Techniques App 20100070199 - MENDENHALL; SCOTT NELSON ; et al.	2010-03-18
Method and system for measuring optical properties of a medium using digital communication processing techniques Grant 7,616,888 - Mendenhall , et al. November 10, 2	2009-11-10
System and method for optimization-based sensor steering and tracking Grant 7,221,436 - Mendenhall , et al. May 22, 2	2007-05-22
Active multiple-color imaging polarimetry Grant 7,072,039 - Dobbs , et al. July 4, 2	2006-07-04
Active remote sensing using a simultaneous spectral sampling technique Grant 7,009,170 - Dobbs , et al. March 7, 2	2006-03-07
Active remote sensing using a spectral lock-in technique Grant 6,949,734 - Neff , et al. September 27, 2	2005-09-27
Method and system for measuring optical properties of a medium using digital communication processing techniques App 20050100336 - Mendenhall, Scott Nelson ; et al.	2005-05-12
Active multiple-color imaging polarimetry App 20050041249 - Dobbs, Michael E. ; et al.	2005-02-24
Active remote sensing using a simultaneous spectral sampling technique App 20040263851 - Dobbs, Michael E. ; et al.	2004-12-30
Active remote sensing using a spectral lock-in technique App 20040212804 - Neff, Benjamin R. ; et al.	2004-10-28

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