Nayeri; Majid
Patent Applications and Registrations
Patent applications and USPTO patent grants for Nayeri; Majid.The latest application filed is for "systems and methods for generating a single observation image to analyze coating defects".
- Nayeri; Majid - Niskayuna NY
- Nayeri; Majid - Ann Arbor MI
| Patent | Date |
|---|---|
| Systems And Methods For Automatic Detection Of Coating Defects App 20220074056 - Nalladega; Venkata Vijayaraghava ; et al. | 2022-03-10 |
| Systems And Methods For Generating A Single Observation Image To Analyze Coating Defects App 20220076407 - Nayeri; Majid ; et al. | 2022-03-10 |
| Route examining system Grant 11,136,053 - Plotnikov , et al. October 5, 2 | 2021-10-05 |
| Cooling hole inspection system Grant 10,551,327 - Nayeri , et al. Fe | 2020-02-04 |
| Route examining system Grant 10,501,100 - Plotnikov , et al. Dec | 2019-12-10 |
| Route Examining System App 20190344814 - Plotnikov; Yuri Alexeyevich ; et al. | 2019-11-14 |
| Cooling Hole Inspection System App 20190317025 - Nayeri; Majid ; et al. | 2019-10-17 |
| Route Examining System App 20180065650 - Plotnikov; Yuri Alexeyevich ; et al. | 2018-03-08 |
| Systems and methods for distributed measurement Grant 9,869,607 - Mandal , et al. January 16, 2 | 2018-01-16 |
| Route examining system and method Grant 9,834,237 - Plotnikov , et al. December 5, 2 | 2017-12-05 |
| Route examining system Grant 9,802,631 - Matthews , et al. October 31, 2 | 2017-10-31 |
| Systems And Methods For Distributed Measurement App 20170307471 - Mandal; Sudeep ; et al. | 2017-10-26 |
| Route Examining System App 20160194012 - Matthews; Brett Alexander ; et al. | 2016-07-07 |
| Route Examining System And Method App 20150367872 - Plotnikov; Yuri Alexeyevich ; et al. | 2015-12-24 |
uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.
While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.
All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.
| 