Nayar; Shree

Patent Applications and Registrations

Patent applications and USPTO patent grants for Nayar; Shree.The latest application filed is for "systems and methods for controlling aliasing in images captured by an array camera for use in super resolution processing using pixel apertures".

Company Profile

1.12.13

Nayar; Shree - New York NY

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Systems and methods for controlling aliasing in images captured by an array camera for use in super resolution processing using pixel apertures Grant 10,375,302 - Nayar , et al.	2019-08-06
Systems and Methods for Controlling Aliasing in Images Captured by an Array Camera for use in Super Resolution Processing Using Pixel Apertures App 20180097993 - Nayar; Shree ; et al.	2018-04-05
Systems and methods for controlling aliasing in images captured by an array camera for use in super resolution processing using pixel apertures Grant 9,794,476 - Nayar , et al. October 17, 2	2017-10-17
Systems And Methods For Controlling Aliasing In Images Captured By An Array Camera For Use In Super Resolution Processing Using Pixel Apertures App 20160316140 - Nayar; Shree ; et al.	2016-10-27
Systems, Methods, And Media For Generating Structured Light App 20160065945 - YIN; Qi ; et al.	2016-03-03
Profilometer, measuring apparatus, and observing apparatus Grant 8,717,578 - Ohnishi , et al. May 6, 2	2014-05-06
Systems And Methods For Controlling Aliasing In Images Captured By Anarray Camera For Use In Super Resolution Processing Using Pixel Apertures App 20140098266 - Nayar; Shree ; et al.	2014-04-10
Apparatus and method for inspecting surface state Grant 8,615,125 - Mori , et al. December 24, 2	2013-12-24
Shape measuring apparatus and shape measuring method Grant 8,334,985 - Sho , et al. December 18, 2	2012-12-18
Shape Measuring Apparatus And Shape Measuring Method App 20120086950 - Sho; To ; et al.	2012-04-12
Apparatus And Method For Inspecting Surface State App 20120087566 - Mori; Yasumoto ; et al.	2012-04-12
Profilometer, Measuring Apparatus, And Observing Apparatus App 20120044504 - Ohnishi; Yasuhiro ; et al.	2012-02-23
System and method for sensing geometric and photometric attributes of a scene with multiplexed illumination and solid states optical devices Grant 8,009,192 - Raskar , et al. August 30, 2	2011-08-30
Profilometer App 20100259746 - Ohnishi; Yasuhiro ; et al.	2010-10-14
Methods and systems for compensating an image projected onto a surface having spatially varying photometric properties Grant 7,663,640 - Nayar , et al. February 16, 2	2010-02-16
System and method for sensing geometric and photometric attributes of a scene with multiplexed illumination and solid states optical devices App 20070268363 - Raskar; Ramesh ; et al.	2007-11-22
Systems and methods for modeling the impact of a medium on the appearances of encompassed light sources Grant 7,106,327 - Narasimhan , et al. September 12, 2	2006-09-12
Methods and systems for compensating an image projected onto a surface having spatially varying photometric properties App 20050134599 - Nayar, Shree ; et al.	2005-06-23
Systems and methods for modeling the impact of a medium on the appearances of encompassed light sources App 20050073682 - Narasimhan, Srinivasa ; et al.	2005-04-07
Systems and methods for tremor cancellation in pointers App 20040151218 - Branzoi, Vlad ; et al.	2004-08-05
Method and apparatus for reducing distortion in images App 20040012544 - Swaminathan, Rahul ; et al.	2004-01-22
Apparatus and methods for determining the three-dimensional shape of an object using active illumination and relative blurring in two-images due to defocus Grant 6,229,913 - Nayar , et al. May 8, 2	2001-05-08
Methods and apparatus for performing digital image and video segmentation and compression using 3-D depth information Grant 6,055,330 - Eleftheriadis , et al. April 25, 2	2000-04-25

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