Patent | Date |
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Beam selection for cellular access nodes Grant 11,425,591 - Maggi , et al. August 23, 2 | 2022-08-23 |
Beam Selection For Cellular Access Nodes App 20220256389 - MAGGI; Lorenzo ;   et al. | 2022-08-11 |
Efficient data generation for beam pattern optimization Grant 11,012,133 - Capdevielle , et al. May 18, 2 | 2021-05-18 |
Efficient Data Generation For Beam Pattern Optimization App 20210083737 - CAPDEVIELLE; Veronique ;   et al. | 2021-03-18 |
Taxonomy generation with statistical analysis and auditing Grant 10,909,144 - Dutta , et al. February 2, 2 | 2021-02-02 |
Classification accuracy estimation Grant 10,726,060 - Dutta , et al. | 2020-07-28 |
Techniques for generating machine learning training data Grant 10,339,470 - Dutta , et al. | 2019-07-02 |
High mobility PMOS and NMOS devices having Si--Ge quantum wells Grant 9,406,799 - Nayak August 2, 2 | 2016-08-02 |
HIGH MOBILITY PMOS AND NMOS DEVICES HAVING Si-Ge QUANTUM WELLS App 20160111539 - Nayak; Deepak Kumar | 2016-04-21 |
Semiconductor device with improved trenches Grant 8,120,075 - Luo , et al. February 21, 2 | 2012-02-21 |
Semiconductor device with backfilled isolation Grant 7,936,006 - Luo , et al. May 3, 2 | 2011-05-03 |
Strain-silicon CMOS using etch-stop layer and method of manufacture Grant 7,875,543 - Luo , et al. January 25, 2 | 2011-01-25 |
Semiconductor device and process for improved etch control of strained silicon alloy trenches Grant 7,851,313 - Luo , et al. December 14, 2 | 2010-12-14 |
Method of and circuit for protecting a transistor formed on a die Grant 7,772,093 - Luo , et al. August 10, 2 | 2010-08-10 |
Method of fabricating strain-silicon CMOS Grant 7,670,923 - Nayak , et al. March 2, 2 | 2010-03-02 |
CMOS device with stressed sidewall spacers Grant 7,655,991 - Nayak , et al. February 2, 2 | 2010-02-02 |
Method of and circuit for protecting a transistor formed on a die App 20090108337 - Luo; Yuhao ;   et al. | 2009-04-30 |
Method of forming silicide gate with interlayer Grant 7,429,526 - Nayak , et al. September 30, 2 | 2008-09-30 |
Method of fabricating strain-silicon CMOS Grant 7,429,775 - Nayak , et al. September 30, 2 | 2008-09-30 |
Strain-silicon CMOS using etch-stop layer and method of manufacture Grant 7,423,283 - Luo , et al. September 9, 2 | 2008-09-09 |
Strain-silicon CMOS with dual-stressed film Grant 7,214,629 - Luo , et al. May 8, 2 | 2007-05-08 |
Method and circuit for detecting boron ("B") in a semiconductor device using threshold voltage ("V") fluence test Grant 5,757,204 - Nayak , et al. May 26, 1 | 1998-05-26 |