Nath; Shridhar Champaknath

Patent Applications and Registrations

Patent applications and USPTO patent grants for Nath; Shridhar Champaknath.The latest application filed is for "modular blade structure and method of assembly".

Company Profile

1.14.18

Nath; Shridhar Champaknath - Niskayuna NY
Nath; Shridhar Champaknath - Niksayuna NY

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Modular blade structure and method of assembly Grant 11,022,094 - Veljkovic , et al. June 1, 2	2021-06-01
Methods for manufacturing wind turbine rotor blades and components thereof Grant 10,830,206 - Tobin , et al. November 10, 2	2020-11-10
Modular Blade Structure And Method Of Assembly App 20180340511 - Veljkovic; Danilo ; et al.	2018-11-29
Methods for Manufacturing Wind Turbine Rotor Blades and Components Thereof App 20180223795 - Tobin; James Robert ; et al.	2018-08-09
Custom Fit Blade Tip For A Rotor Blade Assembly Of A Wind Turbine And Method Of Fabrication App 20170145986 - Baehmann; Peggy Lynn ; et al.	2017-05-25
Eddy current inspection system and method Grant 8,436,608 - Sun , et al. May 7, 2	2013-05-07
Eddy Current Inspection System And Method App 20110068784 - Sun; Haiyan ; et al.	2011-03-24
Devices, Methods And Systems For Measuring One Or More Characteristics Of A Suspension App 20090158821 - Sun; Zongqi ; et al.	2009-06-25
System And Methods For Inspecting Internal Cracks App 20080278151 - Wang; Changting ; et al.	2008-11-13
Eddy Current Array Probes With Enhanced Drive Fields App 20070222439 - Wang; Changting ; et al.	2007-09-27
Method and apparatus for evaluating fluid flow in a heat exchanger App 20060144162 - Batzinger; Thomas James ; et al.	2006-07-06
Eddy current array probes with enhanced drive fields App 20060132123 - Wang; Changting ; et al.	2006-06-22
Omnidirectional eddy current probe and inspection system Grant 7,015,690 - Wang , et al. March 21, 2	2006-03-21
Omnidirectional eddy current probe and inspection system App 20050264284 - Wang, Changting ; et al.	2005-12-01
Pulsed eddy current sensor probes and inspection methods Grant 6,911,826 - Plotnikov , et al. June 28, 2	2005-06-28
Omnidirectional eddy current probes, array probes, and inspection systems Grant 6,888,347 - Batzinger , et al. May 3, 2	2005-05-03
Omnidirectional Eddy Current Probes, Array Probes, And Inspection Systems App 20050057247 - Batzinger, Thomas James ; et al.	2005-03-17
Pulsed eddy current sensor probes and inspection methods App 20040245997 - Plotnikov, Yuri Alexeyevich ; et al.	2004-12-09
Molded eddy current array probe Grant 6,812,697 - McKnight , et al. November 2, 2	2004-11-02
Magnetic device for a magnetic trip unit Grant 6,794,963 - O'Keeffe , et al. September 21, 2	2004-09-21
Pulsed eddy current two-dimensional sensor array inspection probe and system Grant 6,720,775 - Plotnikov , et al. April 13, 2	2004-04-13
Molded eddy current array probe App 20040056656 - McKnight, William Stewart ; et al.	2004-03-25
Method for in-situ eddy current inspection of coated components in turbine engines Grant 6,707,297 - Nath , et al. March 16, 2	2004-03-16
Self reference eddy current probe, measurement system, and measurement method Grant 6,670,808 - Nath , et al. December 30, 2	2003-12-30
Magnetic device for a magnetic trip unit App 20030201857 - O'Keeffe, Thomas Gary ; et al.	2003-10-30
Method for in-situ eddy current inspection of coated components in turbine engines App 20030193331 - Nath, Shridhar Champaknath ; et al.	2003-10-16
Embedded Eddy Current Inspection Apparatus, System, And Method App 20030080736 - Batzinger, Thomas James ; et al.	2003-05-01
Embedded eddy current inspection apparatus, system, and method Grant 6,545,469 - Batzinger , et al. April 8, 2	2003-04-08
Self reference eddy current probe, measurement system, and measurement method App 20030038628 - Nath, Shridhar Champaknath ; et al.	2003-02-27
Pulsed eddy current two-dimensional sensor array inspection probe and system App 20020190724 - Plotnikov, Yuri Alexeyevich ; et al.	2002-12-19
Eddy current inspection method and apparatus for detecting flaws in an electrically conductive component Grant 6,414,483 - Nath , et al. July 2, 2	2002-07-02

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.